Research output: Contribution to journal › Article › peer-review
Study of Structural Modification of Composites with Ge Nanoclusters by Optical and Electron Microscopy Methods. / Astankova, K. N.; Gorokhov, E. B.; Azarov, I. A. et al.
In: Semiconductors, Vol. 53, No. 16, 01.12.2019, p. 2064-2067.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Study of Structural Modification of Composites with Ge Nanoclusters by Optical and Electron Microscopy Methods
AU - Astankova, K. N.
AU - Gorokhov, E. B.
AU - Azarov, I. A.
AU - Volodin, V. A.
AU - Latyshev, A. V.
PY - 2019/12/1
Y1 - 2019/12/1
N2 - Abstract: Composites consisting of Ge nanoclusters embedded in GeO2 matrix were modified by selective removal of the germanium dioxide in deionized water or HF. Thin (up to 200 nm) and thick (300−1500 nm) GeO2{Ge-NCs} heterolayers were studied before and after the etching using Raman spectroscopy, scanning and spectral ellipsometry, scanning electron microscopy. It was found that a stable skeletal framework from agglomerated Ge nanoparticles (amorphous or crystalline) was formed after the etching of thin GeO2{Ge-NCs} heterolayers. When removal the GeO2 matrix from a thick GeO2{Ge-NCs} heterolayer, released Ge nanoclusters were arranged in a vertically ordered chains.
AB - Abstract: Composites consisting of Ge nanoclusters embedded in GeO2 matrix were modified by selective removal of the germanium dioxide in deionized water or HF. Thin (up to 200 nm) and thick (300−1500 nm) GeO2{Ge-NCs} heterolayers were studied before and after the etching using Raman spectroscopy, scanning and spectral ellipsometry, scanning electron microscopy. It was found that a stable skeletal framework from agglomerated Ge nanoparticles (amorphous or crystalline) was formed after the etching of thin GeO2{Ge-NCs} heterolayers. When removal the GeO2 matrix from a thick GeO2{Ge-NCs} heterolayer, released Ge nanoclusters were arranged in a vertically ordered chains.
KW - ellipsometry
KW - nanoclusters
KW - porous Ge
KW - Raman spectroscopy
KW - scanning electron microscopy
UR - http://www.scopus.com/inward/record.url?scp=85078432555&partnerID=8YFLogxK
U2 - 10.1134/S1063782619120030
DO - 10.1134/S1063782619120030
M3 - Article
AN - SCOPUS:85078432555
VL - 53
SP - 2064
EP - 2067
JO - Semiconductors
JF - Semiconductors
SN - 1063-7826
IS - 16
ER -
ID: 23261547