Study of Structural Modification of Composites with Ge Nanoclusters by Optical and Electron Microscopy Methods › Research Explorer

DOI

https://doi.org/10.1134/S1063782619120030
Final published version

K. N. Astankova
E. B. Gorokhov
I. A. Azarov
V. A. Volodin
A. V. Latyshev

Original language	English
Pages (from-to)	2064-2067
Number of pages	4
Journal	Semiconductors
Volume	53
Issue number	16
DOIs	https://doi.org/10.1134/S1063782619120030
Publication status	Published - 1 Dec 2019

OECD FOS+WOS

Research areas

ellipsometry, nanoclusters, porous Ge, Raman spectroscopy, scanning electron microscopy

ID: 23261547