Research output: Contribution to journal › Article › peer-review
Structural and vibrational properties of PVT grown BiTeCl microcrystals. / Atuchin, V. V.; Gavrilova, T. A.; Kokh, K. A. et al.
In: Materials Research Express, Vol. 6, No. 4, 045912, 28.01.2019.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Structural and vibrational properties of PVT grown BiTeCl microcrystals
AU - Atuchin, V. V.
AU - Gavrilova, T. A.
AU - Kokh, K. A.
AU - Kuratieva, N. V.
AU - Pervukhina, N. V.
AU - Surovtsev, N. V.
AU - Tereshchenko, O. E.
PY - 2019/1/28
Y1 - 2019/1/28
N2 - High-quality BiTeCl microcrystals are grown by the physical vapor transport (PVT) method without using a foreign transport agent. The plate-like microcrystals with a developed (0001) surface are up to ∼500 μm in diameter. The grown crystal phase composition was identified by the x-ray single crystal structure analysis in space group P6 3 mc: a = 4.2475(6) Å, c = 12.409(2) Ǻ, Z = 2 (R = 0.0343). The BiTeCl microcrystal phase purity was verified by Raman microspectrometry under excitation at λ = 632.8 and 532.1 nm.
AB - High-quality BiTeCl microcrystals are grown by the physical vapor transport (PVT) method without using a foreign transport agent. The plate-like microcrystals with a developed (0001) surface are up to ∼500 μm in diameter. The grown crystal phase composition was identified by the x-ray single crystal structure analysis in space group P6 3 mc: a = 4.2475(6) Å, c = 12.409(2) Ǻ, Z = 2 (R = 0.0343). The BiTeCl microcrystal phase purity was verified by Raman microspectrometry under excitation at λ = 632.8 and 532.1 nm.
KW - BiTeCl
KW - Crystal structure
KW - PVT crystal growth
KW - Raman spectroscopy
KW - SEM
KW - Topological insulator
KW - topological insulator
KW - VAPOR TRANSPORT
KW - crystal structure
KW - CRYSTAL
KW - BISMUTH
UR - http://www.scopus.com/inward/record.url?scp=85062037514&partnerID=8YFLogxK
U2 - 10.1088/2053-1591/aafd45
DO - 10.1088/2053-1591/aafd45
M3 - Article
AN - SCOPUS:85062037514
VL - 6
JO - Materials Research Express
JF - Materials Research Express
SN - 2053-1591
IS - 4
M1 - 045912
ER -
ID: 18623040