Translated title of the contributionПрограммная компенсация систематических ошибок для сканирующей профилометрии in situ
Original languageEnglish
Number of pages7
JournalOptics and Lasers in Engineering
Volume206
DOIs
Publication statusPublished - Nov 2026

    Research areas

  • Scanning profilometry, On-machine metrology, Systematic error compensation, Self-referenced measurement, Surface form reconstruction

    OECD FOS+WOS

  • 2.02 ELECTRICAL ENG, ELECTRONIC ENG
  • 1.03.SY OPTICS
  • 1.01.PN MATHEMATICS, APPLIED

ID: 82542086