Resonance reflection of light by ordered silicon nanopillar arrays with the vertical p-n junction › Research Explorer

DOI

https://doi.org/10.1016/j.tsf.2019.01.007
Final published version

L. S. Basalaeva
Yu V. Nastaushev
N. V. Kryzhanovskaya
E. I. Moiseev
D. A. Radnatarov
S. A. Khripunov
D. E. Utkin
I. B. Chistokhin
A. V. Latyshev
F. N. Dultsev

Original language	English
Pages (from-to)	109-113
Number of pages	5
Journal	Thin Solid Films
Volume	672
DOIs	https://doi.org/10.1016/j.tsf.2019.01.007
Publication status	Published - 28 Feb 2019

Research areas

Electron beam lithography, Electrophysical properties, Reactive ion etching, Reflectance spectra, Silicon nanopillars

OECD FOS+WOS

2.05 MATERIALS ENGINEERING
1.03 PHYSICAL SCIENCES AND ASTRONOMY

ID: 18295071