Standard

Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids. / Fedyukhin, L. A.; Gorchakov, A. V.; Korobeishchikov, N. G. et al.

In: JETP Letters, Vol. 114, No. 5, 3, 09.2021, p. 256-262.

Research output: Contribution to journal › Article › peer-review

Harvard

Fedyukhin, LA, Gorchakov, AV, Korobeishchikov, NG & Nikolaev, IV 2021, 'Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids', JETP Letters, vol. 114, no. 5, 3, pp. 256-262. https://doi.org/10.1134/S0021364021170069

APA

Fedyukhin, L. A., Gorchakov, A. V., Korobeishchikov, N. G., & Nikolaev, I. V. (2021). Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids. JETP Letters, 114(5), 256-262. [3]. https://doi.org/10.1134/S0021364021170069

Vancouver

Fedyukhin LA, Gorchakov AV, Korobeishchikov NG, Nikolaev IV. Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids. JETP Letters. 2021 Sept;114(5):256-262. 3. doi: 10.1134/S0021364021170069

Author

Fedyukhin, L. A. ; Gorchakov, A. V. ; Korobeishchikov, N. G. et al. / Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids. In: JETP Letters. 2021 ; Vol. 114, No. 5. pp. 256-262.

BibTeX

@article{d814e0fe3b2b4568b636d68c7a830d3f,
title = "Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids",
abstract = "A measurement method and a calculation algorithm based on the three-layer structure model have been proposed for the refractive index of optical materials. The method has been experimentally tested with refractive index standards. The uniqueness of the reconstruction of the refractive indices of the substrate and subsurface layer, as well as the thickness of the layer, from the measured reflection coefficient of probe radiation near the Brewster angle and the angle of normal incidence has been demonstrated numerically. The measurements of the refractive index of the subsurface layer with an absolute error of 10–4 and the thickness of the subsurface layer with a confidence error of 1 nm have been performed for the first time.",
author = "Fedyukhin, {L. A.} and Gorchakov, {A. V.} and Korobeishchikov, {N. G.} and Nikolaev, {I. V.}",
note = "Funding Information: This work was supported by the Russian Foundation for Basic Research and Novosibirsk region (project no. 20-42-540004, measurements) and by the Russian Science Foundation (project no. 21-19-00046, preparation of the samples). Publisher Copyright: {\textcopyright} 2021, Pleiades Publishing, Inc.",
year = "2021",
month = sep,
doi = "10.1134/S0021364021170069",
language = "English",
volume = "114",
pages = "256--262",
journal = "JETP Letters",
issn = "0021-3640",
publisher = "MAIK NAUKA/INTERPERIODICA/SPRINGER",
number = "5",

}

RIS

TY - JOUR

T1 - Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids

AU - Fedyukhin, L. A.

AU - Gorchakov, A. V.

AU - Korobeishchikov, N. G.

AU - Nikolaev, I. V.

N1 - Funding Information: This work was supported by the Russian Foundation for Basic Research and Novosibirsk region (project no. 20-42-540004, measurements) and by the Russian Science Foundation (project no. 21-19-00046, preparation of the samples). Publisher Copyright: © 2021, Pleiades Publishing, Inc.

PY - 2021/9

Y1 - 2021/9

N2 - A measurement method and a calculation algorithm based on the three-layer structure model have been proposed for the refractive index of optical materials. The method has been experimentally tested with refractive index standards. The uniqueness of the reconstruction of the refractive indices of the substrate and subsurface layer, as well as the thickness of the layer, from the measured reflection coefficient of probe radiation near the Brewster angle and the angle of normal incidence has been demonstrated numerically. The measurements of the refractive index of the subsurface layer with an absolute error of 10–4 and the thickness of the subsurface layer with a confidence error of 1 nm have been performed for the first time.

AB - A measurement method and a calculation algorithm based on the three-layer structure model have been proposed for the refractive index of optical materials. The method has been experimentally tested with refractive index standards. The uniqueness of the reconstruction of the refractive indices of the substrate and subsurface layer, as well as the thickness of the layer, from the measured reflection coefficient of probe radiation near the Brewster angle and the angle of normal incidence has been demonstrated numerically. The measurements of the refractive index of the subsurface layer with an absolute error of 10–4 and the thickness of the subsurface layer with a confidence error of 1 nm have been performed for the first time.

UR - http://www.scopus.com/inward/record.url?scp=85118540979&partnerID=8YFLogxK

U2 - 10.1134/S0021364021170069

DO - 10.1134/S0021364021170069

M3 - Article

AN - SCOPUS:85118540979

VL - 114

SP - 256

EP - 262

JO - JETP Letters

JF - JETP Letters

SN - 0021-3640

IS - 5

M1 - 3

ER -

ID: 34606273