• V. N. Kruchinin
  • T. V. Perevalov
  • G. N. Kamaev
  • S. V. Rykhlitskii
  • V. A. Gritsenko
Original languageEnglish
Pages (from-to)836-840
Number of pages5
JournalOptics and Spectroscopy
Volume127
Issue number5
DOIs
Publication statusPublished - 1 Nov 2019

    Research areas

  • ab initio modeling, ellipsometry, optical properties, silicon oxide

    OECD FOS+WOS

ID: 22979414