Nanoscale potential fluctuations and electron percolation in silicon oxide (SiOx, x = 1.4, 1.6) › Research Explorer

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Nanoscale potential fluctuations and electron percolation in silicon oxide (SiO_x, x = 1.4, 1.6)

Research output: Contribution to journal › Article › peer-review

Лаборатория полупроводниковых и диэлектрических материалов ФФ

DOI

https://doi.org/10.1088/2053-1591/ab4487
Final published version

V. A. Gritsenko
Yu N. Novikov
A. Chin

Original language	English
Article number	116409
Journal	Materials Research Express
Volume	6
Issue number	11
DOIs	https://doi.org/10.1088/2053-1591/ab4487
Publication status	Published - 27 Sept 2019

OECD FOS+WOS

Research areas

electron percolation, nanoscale potential fluctuations, SiOx film, XPS, TRANSPORT, PHOTOLUMINESCENCE

ID: 21937774