Multiphonon trap ionization transport in nonstoichiometric SiNx › Research Explorer

DOI

https://doi.org/10.1088/2053-1591/aaf61e
Final published version

V. A. Gritsenko
A. A. Gismatulin
A. Chin

Original language	English
Article number	036304
Number of pages	9
Journal	Materials Research Express
Volume	6
Issue number	3
DOIs	https://doi.org/10.1088/2053-1591/aaf61e
Publication status	Published - 1 Mar 2019

Research areas

Charge transport, percolation, traps, traps ionization, RETENTION, CHARGE-TRANSPORT, MECHANISMS, NITRIDE, charge transport, ELECTRICAL-CONDUCTION, MEMORY, INTERFACE, DEVICES, AL2O3

OECD FOS+WOS

ID: 18068974