Microstructure and dispersive optical parameters of iron films deposited by the thermal evaporation method › Research Explorer

DOI

https://doi.org/10.1016/j.ijleo.2019.04.122
Final published version

V. V. Atuchin
V. A. Kochubey
A. S. Kozhukhov
V. N. Kruchinin
L. D. Pokrovsky
I. S. Soldatenkov
I. B. Troitskaia

Original language	English
Pages (from-to)	120-125
Number of pages	6
Journal	Optik
Volume	188
DOIs	https://doi.org/10.1016/j.ijleo.2019.04.122
Publication status	Published - 1 Jul 2019

Research areas

Iron film, Microrelief, Spectroscopic ellipsometry, Structure, Thermal evaporation, THIN-FILMS, CONSTANTS, THICKNESS DEPENDENCE, GROWTH, SURFACE, MAGNETIC-PROPERTIES, NI, ABSORPTION, ELECTRONIC-STRUCTURE, FE

OECD FOS+WOS

1.03.SY OPTICS

ID: 20040233