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Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces. / Atuchin, V. V.; Bekenev, V. L.; Borovlev, Yu A. et al.

In: Journal of Optoelectronics and Advanced Materials, Vol. 19, No. 1-2, 01.01.2017, p. 86-90.

Research output: Contribution to journal › Article › peer-review

Harvard

Atuchin, VV, Bekenev, VL, Borovlev, YA, Galashov, EN, Khyzhun, OY, Kozhukhov, AS, Pokrovsky, LD & Zhdankov, VN 2017, 'Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces', Journal of Optoelectronics and Advanced Materials, vol. 19, no. 1-2, pp. 86-90.

APA

Atuchin, V. V., Bekenev, V. L., Borovlev, Y. A., Galashov, E. N., Khyzhun, O. Y., Kozhukhov, A. S., Pokrovsky, L. D., & Zhdankov, V. N. (2017). Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces. Journal of Optoelectronics and Advanced Materials, 19(1-2), 86-90.

Vancouver

Atuchin VV, Bekenev VL, Borovlev YA, Galashov EN, Khyzhun OY, Kozhukhov AS et al. Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces. Journal of Optoelectronics and Advanced Materials. 2017 Jan 1;19(1-2):86-90.

Author

Atuchin, V. V. ; Bekenev, V. L. ; Borovlev, Yu A. et al. / Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces. In: Journal of Optoelectronics and Advanced Materials. 2017 ; Vol. 19, No. 1-2. pp. 86-90.

BibTeX

@article{99e830ec7bba4318ad0dfc7e4ff4fab7,
title = "Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces",
abstract = "The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO 4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface.",
keywords = "CdWO, Czochralski growth, Electronic structure, RHEED, AFM, XPS, ZnWO",
author = "Atuchin, {V. V.} and Bekenev, {V. L.} and Borovlev, {Yu A.} and Galashov, {E. N.} and Khyzhun, {O. Y.} and Kozhukhov, {A. S.} and Pokrovsky, {L. D.} and Zhdankov, {V. N.}",
note = "Publisher Copyright: {\textcopyright} 2017, National Institute of Optoelectronics. All rights reserved.",
year = "2017",
month = jan,
day = "1",
language = "English",
volume = "19",
pages = "86--90",
journal = "Journal of Optoelectronics and Advanced Materials",
issn = "1454-4164",
publisher = "National Institute of Optoelectronics",
number = "1-2",

}

RIS

TY - JOUR

T1 - Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces

AU - Atuchin, V. V.

AU - Bekenev, V. L.

AU - Borovlev, Yu A.

AU - Galashov, E. N.

AU - Khyzhun, O. Y.

AU - Kozhukhov, A. S.

AU - Pokrovsky, L. D.

AU - Zhdankov, V. N.

N1 - Publisher Copyright: © 2017, National Institute of Optoelectronics. All rights reserved.

PY - 2017/1/1

Y1 - 2017/1/1

N2 - The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO 4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface.

AB - The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO 4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface.

KW - CdWO

KW - Czochralski growth

KW - Electronic structure

KW - RHEED, AFM

KW - XPS

KW - ZnWO

UR - http://www.scopus.com/inward/record.url?scp=85017522281&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:85017522281

VL - 19

SP - 86

EP - 90

JO - Journal of Optoelectronics and Advanced Materials

JF - Journal of Optoelectronics and Advanced Materials

SN - 1454-4164

IS - 1-2

ER -

ID: 9076737