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Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces. / Atuchin, V. V.; Bekenev, V. L.; Borovlev, Yu A. и др.
в: Journal of Optoelectronics and Advanced Materials, Том 19, № 1-2, 01.01.2017, стр. 86-90.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces
AU - Atuchin, V. V.
AU - Bekenev, V. L.
AU - Borovlev, Yu A.
AU - Galashov, E. N.
AU - Khyzhun, O. Y.
AU - Kozhukhov, A. S.
AU - Pokrovsky, L. D.
AU - Zhdankov, V. N.
N1 - Publisher Copyright: © 2017, National Institute of Optoelectronics. All rights reserved.
PY - 2017/1/1
Y1 - 2017/1/1
N2 - The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO 4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface.
AB - The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO 4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface.
KW - CdWO
KW - Czochralski growth
KW - Electronic structure
KW - RHEED, AFM
KW - XPS
KW - ZnWO
UR - http://www.scopus.com/inward/record.url?scp=85017522281&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:85017522281
VL - 19
SP - 86
EP - 90
JO - Journal of Optoelectronics and Advanced Materials
JF - Journal of Optoelectronics and Advanced Materials
SN - 1454-4164
IS - 1-2
ER -
ID: 9076737