Research output: Contribution to journal › Article › peer-review
High resolution micro-pattern gas detectors for particle physics. / Shekhtman, L.; Aulchenko, V.; Bobrovnikov, V. et al.
In: Journal of Instrumentation, Vol. 12, No. 7, 07037, 27.07.2017.Research output: Contribution to journal › Article › peer-review
}
TY - JOUR
T1 - High resolution micro-pattern gas detectors for particle physics
AU - Shekhtman, L.
AU - Aulchenko, V.
AU - Bobrovnikov, V.
AU - Bondar, A.
AU - Fedotovich, G.
AU - Kudryavtsev, V.
AU - Maltsev, T.
AU - Nikolenko, D.
AU - Rachek, I.
AU - Zhilich, V.
AU - Zhulanov, V.
PY - 2017/7/27
Y1 - 2017/7/27
N2 - Micro-pattern gaseous detectors (MPGDs) allow operation at very high background particle flux with high efficiency and spatial resolution. This combination of parameters determines the main application of these detectors in particle physics experiments: precise tracking in the areas close to the beam and in the end-cap regions of general-purpose detectors. MPGDs of different configurations have been developed and are under development for several experiments in the Budker INP. The system of eight two-coordinate detectors based on a cascade of Gas Electron Multipliers (GEM) is working in the KEDR experiment at the VEPP-4M collider in the tagging system that detects electrons and positrons that lost their energy in two-photon interactions and left the equilibrium orbit due to a dedicated magnetic system. Another set of cascaded GEM detectors is developed for the almost-real Photon Tagging System (PTS) of the DEUTRON facility at the VEPP-3 storage ring. The PTS contains three very light detectors with very high spatial resolution (below 50 μm). Dedicated detectors based on cascaded GEMs are developed for the extracted electron beam facility at the VEPP-4M collider. These devices will allow precise particle tracking with minimal multiple scattering due to very low material content. An upgrade of the coordinate system of the CMD-3 detector at the VEPP-2000 collider is proposed on the basis of the resistive micro-WELL (μ-rWELL). A research activity on this subject has just started.
AB - Micro-pattern gaseous detectors (MPGDs) allow operation at very high background particle flux with high efficiency and spatial resolution. This combination of parameters determines the main application of these detectors in particle physics experiments: precise tracking in the areas close to the beam and in the end-cap regions of general-purpose detectors. MPGDs of different configurations have been developed and are under development for several experiments in the Budker INP. The system of eight two-coordinate detectors based on a cascade of Gas Electron Multipliers (GEM) is working in the KEDR experiment at the VEPP-4M collider in the tagging system that detects electrons and positrons that lost their energy in two-photon interactions and left the equilibrium orbit due to a dedicated magnetic system. Another set of cascaded GEM detectors is developed for the almost-real Photon Tagging System (PTS) of the DEUTRON facility at the VEPP-3 storage ring. The PTS contains three very light detectors with very high spatial resolution (below 50 μm). Dedicated detectors based on cascaded GEMs are developed for the extracted electron beam facility at the VEPP-4M collider. These devices will allow precise particle tracking with minimal multiple scattering due to very low material content. An upgrade of the coordinate system of the CMD-3 detector at the VEPP-2000 collider is proposed on the basis of the resistive micro-WELL (μ-rWELL). A research activity on this subject has just started.
KW - Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)
KW - Particle tracking detectors (Gaseous detectors)
KW - PROJECT
KW - KLOE-2 INNER TRACKER
KW - KEDR TAGGING SYSTEM
KW - WELL
KW - UPGRADE
KW - VEPP-2000
KW - STORAGE-RING
UR - http://www.scopus.com/inward/record.url?scp=85026755076&partnerID=8YFLogxK
U2 - 10.1088/1748-0221/12/07/C07037
DO - 10.1088/1748-0221/12/07/C07037
M3 - Article
AN - SCOPUS:85026755076
VL - 12
JO - Journal of Instrumentation
JF - Journal of Instrumentation
SN - 1748-0221
IS - 7
M1 - 07037
ER -
ID: 9978325