DOI

  • Ivan A. Aleksandrov
  • Timur V. Malin
  • Denis S. Milakhin
  • Boris Ya Ber
  • Dmitrii Yu Kazantsev
  • Konstantin S. Zhuravlev
Original languageEnglish
Article number125006
Number of pages9
JournalSemiconductor Science and Technology
Volume35
Issue number12
DOIs
Publication statusPublished - Oct 2020

    Research areas

  • AlN, defects, photoluminescence, KINETICS, EMISSION

    OECD FOS+WOS

ID: 26005230