DOI

Original languageEnglish
Pages (from-to)169-185
Number of pages17
JournalJournal of Structural Chemistry
Volume65
Issue number1
DOIs
Publication statusPublished - Jan 2024

    Research areas

  • 2D detector calibration, X-ray diffraction analysis, accuracy of measuring unit cell parameters, diffraction data processing, goniometer calibration, high-temperature XRD, single-crystal diffractometer

    OECD FOS+WOS

  • 1.04.EI CHEMISTRY, PHYSICAL
  • 1.04.EC CHEMISTRY, INORGANIC & NUCLEAR

ID: 60461436