Charge transport mechanism in SiNx-based memristor › Research Explorer

DOI

https://doi.org/10.1063/1.5127039
Final published version

A. A. Gismatulin
V. A. Gritsenko
T. J. Yen
A. Chin

Original language	English
Article number	253502
Number of pages	5
Journal	Applied Physics Letters
Volume	115
Issue number	25
DOIs	https://doi.org/10.1063/1.5127039
Publication status	Published - 16 Dec 2019

OECD FOS+WOS

Research areas

CONDUCTION, DIFFUSION

ID: 22979326