TY - JOUR

T1 - Charge transport mechanism in dielectrics

T2 - drift and diffusion of trapped charge carriers

AU - Pil’nik, Andrey A.

AU - Chernov, Andrey A.

AU - Islamov, Damir R.

PY - 2020/12/1

Y1 - 2020/12/1

N2 - In this study, we developed a continuum theory of the charge transport in dielectrics by trapped electrons and holes, which takes into account two separate contributions of the current of trapped charge carriers: the drift part and the diffusion one. It was shown that drift current is mostly dominant in the bulk, while the diffusion one reaches significant values near contacts. A comparison with other theoretical models and experiments shows a good agreement. The model can be extended to two- and three-dimensional systems. The developed model, formulated in partial differential equations, can be numerically implemented in the finite element method code.

AB - In this study, we developed a continuum theory of the charge transport in dielectrics by trapped electrons and holes, which takes into account two separate contributions of the current of trapped charge carriers: the drift part and the diffusion one. It was shown that drift current is mostly dominant in the bulk, while the diffusion one reaches significant values near contacts. A comparison with other theoretical models and experiments shows a good agreement. The model can be extended to two- and three-dimensional systems. The developed model, formulated in partial differential equations, can be numerically implemented in the finite element method code.

KW - ELECTRICAL-CONDUCTIVITY

KW - NONVOLATILE MEMORY

KW - CONSTANT

KW - EMISSION

KW - MODEL

UR - http://www.scopus.com/inward/record.url?scp=85091476911&partnerID=8YFLogxK

U2 - 10.1038/s41598-020-72615-1

DO - 10.1038/s41598-020-72615-1

M3 - Article

C2 - 32978427

AN - SCOPUS:85091476911

VL - 10

JO - Scientific Reports

JF - Scientific Reports

SN - 2045-2322

IS - 1

M1 - 15759

ER -