Charge Transport in MIS Structures ITO/[GeOx](z)[SiO2](1–z)/Si › Research Explorer

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Charge Transport in MIS Structures ITO/[GeOx](z)[SiO2](1–z)/Si

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.1134/S1063739725601699
Final published version

I. Yushkov
A. Gismatulin
G. Kamaev
M. Vergnat
V. A. Volodin

Original language	English
Pages (from-to)	842-847
Number of pages	6
Journal	Russian Microelectronics
Volume	54
Issue number	8
DOIs	https://doi.org/10.1134/S1063739725601699
Publication status	Published - Dec 2025

OECD FOS+WOS

2.05 MATERIALS ENGINEERING

Research areas

MIS structures, charge transport, charge traps, germanosilicate glass, space charge limited current

ID: 75917207