DOI

Translated title of the contributionX-RAY CERTIFICATION OF SI, GE, LAB6, AND INSB SINGLE CRYSTALS
Original languageRussian
Article number148915
JournalЖурнал структурной химии
Volume66
Issue number7
DOIs
Publication statusPublished - 2025

    Research areas

  • X-RAY DIFFRACTOMETRY, 2D DETECTOR, SMALL CRYSTALS, UNIT CELL PARAMETERS, PRECISION, STANDARD REFERENCE MATERIAL, ECCENTRICITY

    OECD FOS+WOS

  • 1.04 CHEMICAL SCIENCES

ID: 74110810