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Способ измерения параметров элементарной ячейки кристаллов на установках, использующих 2D-детекторы
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Patent
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Patent for invention
Laboratory for Ultrafine and Nano-Structured Systems Structural Diagnostics
Section of Physical Methods of Solid State Research
Department of Physics
Overview
Cite this
Links
https://new.fips.ru/registers-doc-view/fips_servlet?DB=RUPAT&DocNumber=2857482&TypeFile=html
Сергей Александрович Громилов
(Author)
Полина Сергеевна Серебренникова
(Author)
Original language
Russian
Patent number
2857482
Priority date
14.10.2025
Filing date
14.10.2025
Publication status
Published -
3 Mar 2026
ID: 72438937
