Towards the Impact of Pruning Criteria and Tuning Approach on Model Interpretability and Quality

Shcherbin, A., 2024, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1800-1805 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Gaussian Based Active Learning Algorithm for Image Classification Problem

Shcherbin, A. & Yakhyaeva, G., 30 Jun 2021, 2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings. IEEE Computer Society, p. 542-546 5 p. 9507644. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; vol. 2021-June).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review