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Gaussian Based Active Learning Algorithm for Image Classification Problem

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

DOI

https://doi.org/10.1109/EDM52169.2021.9507644
Final published version

Original language	English
Title of host publication	2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings
Publisher	IEEE Computer Society
Pages	542-546
Number of pages	5
ISBN (Electronic)	9781665414982
DOIs	https://doi.org/10.1109/EDM52169.2021.9507644
Publication status	Published - 30 Jun 2021
Event	22nd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Aya, Altai Region, Russian Federation Duration: 30 Jun 2021 → 4 Jul 2021

Publication series

Name	International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
Volume	2021-June
ISSN (Print)	2325-4173
ISSN (Electronic)	2325-419X

Conference

Conference	22nd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2021
Country/Territory	Russian Federation
City	Aya, Altai Region
Period	30.06.2021 → 04.07.2021

Research areas

active learning, Gaussian filtering, least confidence, machine learning, margin sampling, maximum entropy

OECD FOS+WOS

2.02.IQ ENGINEERING, ELECTRICAL & ELECTRONIC
1.03.UH PHYSICS, ATOMIC, MOLECULAR & CHEMICAL
1.03.SY OPTICS

ID: 34109687