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  1. Charge transport mechanism in [GeOx](z)[SiO2](1-z) based MIS structures

    Yushkov, I. D., Gismatulin, A. A., Prosvirin, I. P., Kamaev, G. N., Marin, D. V., Vergnat, M. & Volodin, V. A., 9 Dec 2024, In: Applied Physics Letters. 125, 24, 242901.

    Research output: Contribution to journal › Article › peer-review

  2. Charge Transport in MIS Structures ITO/[GeOx](z)[SiO2](1–z)/Si

    Yushkov, I., Gismatulin, A., Kamaev, G., Vergnat, M. & Volodin, V. A., Dec 2025, In: Russian Microelectronics. 54, 8, p. 842-847 6 p.

    Research output: Contribution to journal › Article › peer-review

  3. Characterization of Structure, Morphology, Optical and Electrical Properties of AlN–Al–V Multilayer Thin Films Fabricated by Reactive DC Magnetron Sputtering

    Миронова, М. И., Капишников, А. В., Хамуд, Г., Володин, В. А., Азаров, И. А., Юшков, И. Д., Камаев, Г. Н., Супрун, Е., Chirikov, N., Davletkildeev, N. A., Baidakov, A. N., Kovivchak, V. S., Baranova, L. V., Струнин, В. И. & Гейдт, П. В., Feb 2023, In: Coatings. 13, 2, 223.

    Research output: Contribution to journal › Article › peer-review

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