1. Etching of step-bunched Si(1 1 1) surface by Se molecular beam observed by in situ REM

    Rogilo, D. I., Fedina, L. I., Ponomarev, S. A., Sheglov, D. V. & Latyshev, A. V., 1 Jan 2020, In: Journal of Crystal Growth. 529, 125273.

    Research output: Contribution to journalArticlepeer-review

  2. ESR Study of Electron States in Ge/Si Heterostructures with Nanodisc Shaped Quantum Dots

    Zinovieva, A. F., Zinovyev, V. A., Nenashev, A. V., Kulik, L. V. & Dvurechenskii, A. V., 1 Feb 2017, In: Zeitschrift fur Physikalische Chemie. 231, 2, p. 405-423 19 p.

    Research output: Contribution to journalArticlepeer-review

  3. Erratum to: Several Articles in JETP Letters (JETP Letters, (2022), 116, 2, (83-89), 10.1134/S0021364022601208)

    Semenin, N. V., Borisenko, A. S., Zalivako, I. V., Semerikov, I. A., Aksenov, M. D., Khabarova, K. Y., Kolachevsky, N. N., Glazyrin, S. I., Lykov, V. A., Karpov, S. A., Karlykhanov, N. G., Gryaznykh, D. A., Bychenkov, V. Y., Karelina, L. N., Shuravin, N. S., Ionin, A. S., Bakurskiy, S. V., Egorov, S. V., Golovchanskiy, I. A., Chichkov, V. I., & 6 othersBol’ginov, V. V., Ryazanov, V. V., Kazantsev, D. M., Alperovich, V. L., Tkachenko, V. A. & Kvon, Z. D., 2022, In: JETP Letters. 116, 12, p. 912-913 2 p.

    Research output: Contribution to journalArticlepeer-review

  4. ERRATUM TO: SEVERAL ARTICLES IN JETP LETTERS

    Казанцев, Д. М., Альперович, В. Л., Ткаченко, В. А. & Квон, З. Д., Dec 2022, In: JETP Letters. 116, 12, p. 912-913 2 p.

    Research output: Contribution to journalComment/debatepeer-review

  5. Erratum to: Several Articles in JETP Letters (JETP Letters, (2022), 115, 5, (292-296), 10.1134/S0021364022100162)

    Nizamov, B. A., Pshirkov, M. S., Maydykovskiy, A. I., Mamonov, E. A., Mitetelo, N. V., Soria, S., Murzina, T. V., Shvetsov, O. O., Barash, Y. S., Timonina, A. V., Kolesnikov, N. N., Deviatov, E. V., Volovik, G. E., Glazkova, D. A., Estyunin, D. A., Klimovskikh, I. I., Makarova, T. P., Tereshchenko, O. E., Kokh, K. A., Golyashov, V. A., & 8 othersKoroleva, A. V., Shikin, A. M., Sukhanova, E. V., Kvashnin, A. G., Agamalyan, M. A., Zakaryan, H. A., Popov, Z. I. & Lunkin, A. V., Nov 2022, In: JETP Letters. 116, 9, p. 657-659 3 p.

    Research output: Contribution to journalComment/debatepeer-review

  6. Erratum to: Bound State of an Electron in a MOS Structure Due to the Spin–Orbit Interaction (Journal of Experimental and Theoretical Physics, (2018), 127, 6, (1130-1135), 10.1134/S1063776118120075)

    Mahmoodian, M. M. & Chaplik, A. V., 1 May 2019, In: Journal of Experimental and Theoretical Physics. 128, 5, p. 816-816 1 p.

    Research output: Contribution to journalComment/debatepeer-review

  7. Enhancing the photoluminescence response of thick Ge-on-Si layers using photonic crystals

    Yurasov, D., Yablonskiy, A. N., Baidakova, N. A., Shaleev, M., Rodyakina, E. E., Dyakov, S. A. & Novikov, A., 17 Feb 2022, In: Journal Physics D: Applied Physics. 55, 7, 8 p., 075107.

    Research output: Contribution to journalArticlepeer-review

  8. Enhanced surface state protection and band gap in the topological insulator PbBi4 Te4 S3

    Sumida, K., Natsumeda, T., Miyamoto, K., Silkin, I. V., Kuroda, K., Shirai, K., Zhu, S., Taguchi, K., Arita, M., Fujii, J., Varykhalov, A., Rader, O., Golyashov, V. A., Kokh, K. A., Tereshchenko, O. E., Chulkov, E. V., Okuda, T. & Kimura, A., 1 Oct 2018, In: Physical Review Materials. 2, 10, 8 p., 104201.

    Research output: Contribution to journalArticlepeer-review

  9. Enhanced photovoltage on the surface of topological insulator via optical aging

    Yoshikawa, T., Ishida, Y., Sumida, K., Chen, J., Kokh, K. A., Tereshchenko, O. E., Shin, S. & Kimura, A., 7 May 2018, In: Applied Physics Letters. 112, 19, 4 p., 192104.

    Research output: Contribution to journalArticlepeer-review

  10. Enhanced optical properties of silicon based quantum dot heterostructures

    Dvurechenskii, A., Yakimov, A., Kirienko, V., Bloshkin, A., Zinovyev, V., Zinovieva, A. & Mudryi, A., 1 Jan 2018, Physics and Technology of Nanostructured Materials. Trans Tech Publications Ltd, Vol. 386 DDF. p. 68-74 7 p. (Defect and Diffusion Forum; vol. 386 DDF).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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