1. 2019
  2. Real-time observation of self-interstitial reactions on an atomically smooth silicon surface

    Kosolobov, S., Nazarikov, G., Sitnikov, S., Pshenichnyuk, I., Fedina, L. & Latyshev, A., 1 Sept 2019, In: Surface Science. 687, p. 25-33 9 p.

    Research output: Contribution to journalArticlepeer-review

  3. Surface Сonductivity Dynamics in PbSnTe:In Films in the Vicinity of a Band Inversion: In Films in the Vicinity of a Band Inversion

    Klimov, A. E., Akimov, A. N., Akhundov, I. O., Golyashov, V. A., Gorshkov, D. V., Ishchenko, D. V., Sidorov, G. Y., Suprun, S. P., Tarasov, A. S., Epov, V. S. & Tereshchenko, O. E., 1 Sept 2019, In: Semiconductors. 53, 9, p. 1182-1186 5 p.

    Research output: Contribution to journalArticlepeer-review

  4. Atomic and electronic structures of the native defects responsible for the resistive effect in HfO2: ab initio simulations

    Perevalov, T. V. & Islamov, D. R., 15 Aug 2019, In: Microelectronic Engineering. 216, 5 p., 111038.

    Research output: Contribution to journalArticlepeer-review

  5. Effect of oxygen vacancies on the ferroelectric Hf0.5Zr0.5O2 stabilization: DFT simulation

    Islamov, D. R. & Perevalov, T. V., 15 Aug 2019, In: Microelectronic Engineering. 216, 4 p., 111041.

    Research output: Contribution to journalArticlepeer-review

  6. Kinetics of anticrossing between slip traces and vicinal steps on crystal surfaces

    Coupeau, C., Kazantsev, D. M., Drouet, M. & Alperovich, V. L., 15 Aug 2019, In: Acta Materialia. 175, p. 206-213 8 p.

    Research output: Contribution to journalArticlepeer-review

  7. Step bunching phenomena on Si(0 0 1) surface induced by DC heating during sublimation and Si deposition

    Rodyakina, E. E., Sitnikov, S. V., Rogilo, D. I. & Latyshev, A. V., 15 Aug 2019, In: Journal of Crystal Growth. 520, p. 85-88 4 p.

    Research output: Contribution to journalArticlepeer-review

  8. Topological Protection Brought to Light by the Time-Reversal Symmetry Breaking

    Piatrusha, S. U., Tikhonov, E. S., Kvon, Z. D., Mikhailov, N. N., Dvoretsky, S. A. & Khrapai, V. S., 2 Aug 2019, In: Physical Review Letters. 123, 5, 6 p., 056801.

    Research output: Contribution to journalArticlepeer-review

  9. Electron emission from GaAs(Cs,O): Transition from negative to positive effective affinity

    Zhuravlev, A. G., Khoroshilov, V. S. & Alperovich, V. L., 31 Jul 2019, In: Applied Surface Science. 483, p. 895-900 6 p.

    Research output: Contribution to journalArticlepeer-review

  10. Edge States and Capacitance of a 2D Topological Insulator

    Braginsky, L. S. & Entin, M. V., 1 Jun 2019, In: Physica Status Solidi (B) Basic Research. 256, 6, 4 p., 1800675.

    Research output: Contribution to journalArticlepeer-review

  11. Electromigration Effect on Vacancy Islands Nucleation on Si(100) Surface during Sublimation

    Sitnikov, S. V., Rodyakina, E. E. & Latyshev, A. V., 1 Jun 2019, In: Semiconductors. 53, 6, p. 795-799 5 p.

    Research output: Contribution to journalArticlepeer-review

ID: 3084764