1. 2017
  2. The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

    Islamov, D. R., Perevalov, T. V., Gritsenko, V. A., Aliev, V. S., Saraev, A. A., Kaichev, V. V., Ivanova, E. V., Zamoryanskaya, M. V. & Chin, A., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Inc., p. 493-504 12 p.

    Research output: Chapter in Book/Report/Conference proceedingChapterResearchpeer-review

  3. Two-Dimensional Semimetal in HgTe-Based Quantum Wells

    Kvon, Z. D., Olshanetsky, E. B., Kozlov, D. A., Mikhailov, N. N. & Dvoretsky, S. A., 1 Jan 2017, Advances in Semiconductor Nanostructures: Growth, Characterization, Properties and Applications. Latyshev, AV., Dvurechenskii, AV. & Aseev, AL. (eds.). Elsevier Science Inc., p. 29-48 20 p.

    Research output: Chapter in Book/Report/Conference proceedingChapterResearchpeer-review

  4. 2016
  5. Terahertz resistive response of a two-dimensional topological insulator in a quasiballistic transport regime

    Kvon, Z. D., Dantscher, K. -M., Scherr, M. -T., Yaroshevich, A. S. & Mikhailov, N. N., 1 Nov 2016, In: JETP Letters. 104, 10, p. 716-720 5 p.

    Research output: Contribution to journalArticlepeer-review

  6. Three-dimensional non-linear complex model of dynamic memristor switching

    Chernov, A. A., Islamov, D. R., Pik'nik, A. A., Perevalov, T. V. & Gritsenko, V. A., 1 Jan 2016, NONVOLATILE MEMORIES 5. Karim, Z., Kobayashi, K., Shima, H., Bersuker, G., Shingubara, S., Saito, Y., Park, J. G., Magyari-Kope, B., Kubota, H. & Goux, L. (eds.). 32 ed. ELECTROCHEMICAL SOC INC, p. 95-104 10 p. (ECS Transactions; vol. 75, no. 32).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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