Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
The Influence of the InAlAs Layer Surface Morphology on the Temperature Dependence of Parameters of Au/Ti/n-InAlAs(001) Schottky Diodes. / Chistokhin, I. B.; Aksenov, M. S.; Valisheva, N. A. и др.
в: Technical Physics Letters, Том 45, № 2, 01.02.2019, стр. 180-184.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
}
TY - JOUR
T1 - The Influence of the InAlAs Layer Surface Morphology on the Temperature Dependence of Parameters of Au/Ti/n-InAlAs(001) Schottky Diodes
AU - Chistokhin, I. B.
AU - Aksenov, M. S.
AU - Valisheva, N. A.
AU - Dmitriev, D. V.
AU - Marchishin, I. V.
AU - Toropov, A. I.
AU - Zhuravlev, K. S.
PY - 2019/2/1
Y1 - 2019/2/1
N2 - Growth-related structural defects present on the surface of InAlAs layers grown by molecular beam epitaxy on InP(001) substrates influence the temperature dependences of the current–voltage characteristics of Au/Ti/InAlAs Schottky barriers. It is established that these defects in the form of pits cause the appearance of regions with reduced barrier height. At a surface density of ≥10 7 cm –2 , these defects significantly influence the parameters of the Schottky barriers at temperatures below 200 K.
AB - Growth-related structural defects present on the surface of InAlAs layers grown by molecular beam epitaxy on InP(001) substrates influence the temperature dependences of the current–voltage characteristics of Au/Ti/InAlAs Schottky barriers. It is established that these defects in the form of pits cause the appearance of regions with reduced barrier height. At a surface density of ≥10 7 cm –2 , these defects significantly influence the parameters of the Schottky barriers at temperatures below 200 K.
UR - http://www.scopus.com/inward/record.url?scp=85065409926&partnerID=8YFLogxK
U2 - 10.1134/S106378501902024X
DO - 10.1134/S106378501902024X
M3 - Article
AN - SCOPUS:85065409926
VL - 45
SP - 180
EP - 184
JO - Technical Physics Letters
JF - Technical Physics Letters
SN - 1063-7850
IS - 2
ER -
ID: 20038342