Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films. / Postolova, Svetlana V.; Mironov, Alexey Yu; Baklanov, Mikhail R. и др.
в: Scientific Reports, Том 7, № 1, 1718, 11.05.2017, стр. 1718.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films
AU - Postolova, Svetlana V.
AU - Mironov, Alexey Yu
AU - Baklanov, Mikhail R.
AU - Vinokur, Valerii M.
AU - Baturina, Tatyana I.
PY - 2017/5/11
Y1 - 2017/5/11
N2 - A reentrant temperature dependence of the normal state resistance often referred to as the N-shaped temperature dependence, is omnipresent in disordered superconductors - ranging from high-temperature cuprates to ultrathin superconducting films - that experience superconductor-to-insulator transition. Yet, despite the ubiquity of this phenomenon its origin still remains a subject of debate. Here we investigate strongly disordered superconducting TiN films and demonstrate universality of the reentrant behavior. We offer a quantitative description of the N-shaped resistance curve. We show that upon cooling down the resistance first decreases linearly with temperature and then passes through the minimum that marks the 3D-2D crossover in the system. In the 2D temperature range the resistance first grows with decreasing temperature due to quantum contributions and eventually drops to zero as the system falls into a superconducting state. Our findings demonstrate the prime importance of disorder in dimensional crossover effects.
AB - A reentrant temperature dependence of the normal state resistance often referred to as the N-shaped temperature dependence, is omnipresent in disordered superconductors - ranging from high-temperature cuprates to ultrathin superconducting films - that experience superconductor-to-insulator transition. Yet, despite the ubiquity of this phenomenon its origin still remains a subject of debate. Here we investigate strongly disordered superconducting TiN films and demonstrate universality of the reentrant behavior. We offer a quantitative description of the N-shaped resistance curve. We show that upon cooling down the resistance first decreases linearly with temperature and then passes through the minimum that marks the 3D-2D crossover in the system. In the 2D temperature range the resistance first grows with decreasing temperature due to quantum contributions and eventually drops to zero as the system falls into a superconducting state. Our findings demonstrate the prime importance of disorder in dimensional crossover effects.
KW - CRITICAL-FIELD
KW - DEPENDENCE
KW - INSULATOR-TRANSITION
KW - NORMAL-STATE
KW - PSEUDOGAP
KW - SURFACE
KW - TEMPERATURE
KW - THIN-FILMS
KW - TRANSPORT-PROPERTIES
UR - http://www.scopus.com/inward/record.url?scp=85019254892&partnerID=8YFLogxK
U2 - 10.1038/s41598-017-01753-w
DO - 10.1038/s41598-017-01753-w
M3 - Article
C2 - 28496099
AN - SCOPUS:85019254892
VL - 7
SP - 1718
JO - Scientific Reports
JF - Scientific Reports
SN - 2045-2322
IS - 1
M1 - 1718
ER -
ID: 9866449