Standard

Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films. / Postolova, Svetlana V.; Mironov, Alexey Yu; Baklanov, Mikhail R. et al.

In: Scientific Reports, Vol. 7, No. 1, 1718, 11.05.2017, p. 1718.

Research output: Contribution to journalArticlepeer-review

Harvard

Postolova, SV, Mironov, AY, Baklanov, MR, Vinokur, VM & Baturina, TI 2017, 'Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films', Scientific Reports, vol. 7, no. 1, 1718, pp. 1718. https://doi.org/10.1038/s41598-017-01753-w

APA

Postolova, S. V., Mironov, A. Y., Baklanov, M. R., Vinokur, V. M., & Baturina, T. I. (2017). Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films. Scientific Reports, 7(1), 1718. [1718]. https://doi.org/10.1038/s41598-017-01753-w

Vancouver

Postolova SV, Mironov AY, Baklanov MR, Vinokur VM, Baturina TI. Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films. Scientific Reports. 2017 May 11;7(1):1718. 1718. doi: 10.1038/s41598-017-01753-w

Author

Postolova, Svetlana V. ; Mironov, Alexey Yu ; Baklanov, Mikhail R. et al. / Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films. In: Scientific Reports. 2017 ; Vol. 7, No. 1. pp. 1718.

BibTeX

@article{6879e64b34bf46a9803f17df1ced7eac,
title = "Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films",
abstract = "A reentrant temperature dependence of the normal state resistance often referred to as the N-shaped temperature dependence, is omnipresent in disordered superconductors - ranging from high-temperature cuprates to ultrathin superconducting films - that experience superconductor-to-insulator transition. Yet, despite the ubiquity of this phenomenon its origin still remains a subject of debate. Here we investigate strongly disordered superconducting TiN films and demonstrate universality of the reentrant behavior. We offer a quantitative description of the N-shaped resistance curve. We show that upon cooling down the resistance first decreases linearly with temperature and then passes through the minimum that marks the 3D-2D crossover in the system. In the 2D temperature range the resistance first grows with decreasing temperature due to quantum contributions and eventually drops to zero as the system falls into a superconducting state. Our findings demonstrate the prime importance of disorder in dimensional crossover effects.",
keywords = "CRITICAL-FIELD, DEPENDENCE, INSULATOR-TRANSITION, NORMAL-STATE, PSEUDOGAP, SURFACE, TEMPERATURE, THIN-FILMS, TRANSPORT-PROPERTIES",
author = "Postolova, {Svetlana V.} and Mironov, {Alexey Yu} and Baklanov, {Mikhail R.} and Vinokur, {Valerii M.} and Baturina, {Tatyana I.}",
year = "2017",
month = may,
day = "11",
doi = "10.1038/s41598-017-01753-w",
language = "English",
volume = "7",
pages = "1718",
journal = "Scientific Reports",
issn = "2045-2322",
publisher = "Nature Publishing Group",
number = "1",

}

RIS

TY - JOUR

T1 - Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films

AU - Postolova, Svetlana V.

AU - Mironov, Alexey Yu

AU - Baklanov, Mikhail R.

AU - Vinokur, Valerii M.

AU - Baturina, Tatyana I.

PY - 2017/5/11

Y1 - 2017/5/11

N2 - A reentrant temperature dependence of the normal state resistance often referred to as the N-shaped temperature dependence, is omnipresent in disordered superconductors - ranging from high-temperature cuprates to ultrathin superconducting films - that experience superconductor-to-insulator transition. Yet, despite the ubiquity of this phenomenon its origin still remains a subject of debate. Here we investigate strongly disordered superconducting TiN films and demonstrate universality of the reentrant behavior. We offer a quantitative description of the N-shaped resistance curve. We show that upon cooling down the resistance first decreases linearly with temperature and then passes through the minimum that marks the 3D-2D crossover in the system. In the 2D temperature range the resistance first grows with decreasing temperature due to quantum contributions and eventually drops to zero as the system falls into a superconducting state. Our findings demonstrate the prime importance of disorder in dimensional crossover effects.

AB - A reentrant temperature dependence of the normal state resistance often referred to as the N-shaped temperature dependence, is omnipresent in disordered superconductors - ranging from high-temperature cuprates to ultrathin superconducting films - that experience superconductor-to-insulator transition. Yet, despite the ubiquity of this phenomenon its origin still remains a subject of debate. Here we investigate strongly disordered superconducting TiN films and demonstrate universality of the reentrant behavior. We offer a quantitative description of the N-shaped resistance curve. We show that upon cooling down the resistance first decreases linearly with temperature and then passes through the minimum that marks the 3D-2D crossover in the system. In the 2D temperature range the resistance first grows with decreasing temperature due to quantum contributions and eventually drops to zero as the system falls into a superconducting state. Our findings demonstrate the prime importance of disorder in dimensional crossover effects.

KW - CRITICAL-FIELD

KW - DEPENDENCE

KW - INSULATOR-TRANSITION

KW - NORMAL-STATE

KW - PSEUDOGAP

KW - SURFACE

KW - TEMPERATURE

KW - THIN-FILMS

KW - TRANSPORT-PROPERTIES

UR - http://www.scopus.com/inward/record.url?scp=85019254892&partnerID=8YFLogxK

U2 - 10.1038/s41598-017-01753-w

DO - 10.1038/s41598-017-01753-w

M3 - Article

C2 - 28496099

AN - SCOPUS:85019254892

VL - 7

SP - 1718

JO - Scientific Reports

JF - Scientific Reports

SN - 2045-2322

IS - 1

M1 - 1718

ER -

ID: 9866449