Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Polarization-dependent TERS imaging of a single AlN nanorod. / Milekhin, Ilya A.; Milekhin, Alexander G.; Tsarev, Andrei V. и др.
в: Applied Surface Science, Том 714, 164403, 30.12.2025.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
}
TY - JOUR
T1 - Polarization-dependent TERS imaging of a single AlN nanorod
AU - Milekhin, Ilya A.
AU - Milekhin, Alexander G.
AU - Tsarev, Andrei V.
AU - Latyshev, Alexander V.
AU - Zahn, Dietrich R.T.
N1 - This research was financially supported by the Russian Science Foundation, grant № 22-12-00302-P. The studies were performed using the equipment of the Collective Use Center “Nanostructures”. The authors are grateful to L.A. Nenasheva and A.S. Medvedev for the TERS tip fabrication. The authors acknowledge core facilities “VTAN” (Novosibirsk State University) for the access to its experimental equipment.
PY - 2025/12/30
Y1 - 2025/12/30
N2 - Strong local plasmon enhancement by a metallised (Ag) atomic force microscopy (AFM) tip modifies the phonon response of AlN nanostructures, making the surface optical (SO) phonon modes dominant over other phonon modes in tip-enhanced Raman scattering (TERS). Here, we demonstrate polarization-dependent TERS by SO phonon modes in a single AlN nanorod, with the TERS spectra recorded for incident light polarization directed along or perpendicular to the TERS tip as well as perpendicular to or along the nanorod axis. TERS images recorded for two orthogonal polarizations reveal different distributions of the Raman intensity enhancement. In the conventional TERS geometry (light polarization along the TERS tip and perpendicular the nanorod), intense TERS signals stem from the nanorod centre, while a polarization rotation by 90° with respect to the tip axis modifies the TERS image, leading to Raman intensity enhancement at the nanorod edges. This phenomenon is explained by the different local electric field distribution over the nanorod calculated in the TERS tip vicinity for two polarizations.
AB - Strong local plasmon enhancement by a metallised (Ag) atomic force microscopy (AFM) tip modifies the phonon response of AlN nanostructures, making the surface optical (SO) phonon modes dominant over other phonon modes in tip-enhanced Raman scattering (TERS). Here, we demonstrate polarization-dependent TERS by SO phonon modes in a single AlN nanorod, with the TERS spectra recorded for incident light polarization directed along or perpendicular to the TERS tip as well as perpendicular to or along the nanorod axis. TERS images recorded for two orthogonal polarizations reveal different distributions of the Raman intensity enhancement. In the conventional TERS geometry (light polarization along the TERS tip and perpendicular the nanorod), intense TERS signals stem from the nanorod centre, while a polarization rotation by 90° with respect to the tip axis modifies the TERS image, leading to Raman intensity enhancement at the nanorod edges. This phenomenon is explained by the different local electric field distribution over the nanorod calculated in the TERS tip vicinity for two polarizations.
KW - AlN nanorods
KW - Nanoimaging
KW - Phonons
KW - TERS
KW - Tip-enhanced raman spectroscopy
UR - https://www.scopus.com/pages/publications/105014385093
UR - https://www.mendeley.com/catalogue/f8bfa703-a14c-3ed1-9179-b985da5a0000/
U2 - 10.1016/j.apsusc.2025.164403
DO - 10.1016/j.apsusc.2025.164403
M3 - Article
VL - 714
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
M1 - 164403
ER -
ID: 68971334