Результаты исследований: Научные публикации в периодических изданиях › статья по материалам конференции › Рецензирование
Photoemission properties of flat and rough GaAs surfaces with cesium and oxygen layers. / Zhuravlev, A. G.; Kazantsev, D. M.; Khoroshilov, V. S. и др.
в: Journal of Physics: Conference Series, Том 993, № 1, 012007, 10.04.2018.Результаты исследований: Научные публикации в периодических изданиях › статья по материалам конференции › Рецензирование
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TY - JOUR
T1 - Photoemission properties of flat and rough GaAs surfaces with cesium and oxygen layers
AU - Zhuravlev, A. G.
AU - Kazantsev, D. M.
AU - Khoroshilov, V. S.
AU - Kozhukhov, A. S.
AU - Alperovich, V. L.
N1 - Publisher Copyright: © Published under licence by IOP Publishing Ltd.
PY - 2018/4/10
Y1 - 2018/4/10
N2 - The evolution of surface band bending and the probabilities of electron emission in a vacuum are studied under cesium and oxygen deposition on atomically flat and rough As-rich and Ga-rich GaAs (001) surfaces by means of photoreflectance spectroscopy and photoemission quantum-yield spectroscopy. On the rough surface, as compared to the flat one, the suppression of non-monotonic Cs-induced band bending variations is observed, along with the overall band bending increase. Multiple repeated activations of the GaAs (001) surface by cesium and oxygen followed by vacuum anneals led to an increase in the root-mean-square roughness from Rq 0.1-0.2 nm up to 3 nm. As a result, the probability of electron escape into vacuum decreased by half.
AB - The evolution of surface band bending and the probabilities of electron emission in a vacuum are studied under cesium and oxygen deposition on atomically flat and rough As-rich and Ga-rich GaAs (001) surfaces by means of photoreflectance spectroscopy and photoemission quantum-yield spectroscopy. On the rough surface, as compared to the flat one, the suppression of non-monotonic Cs-induced band bending variations is observed, along with the overall band bending increase. Multiple repeated activations of the GaAs (001) surface by cesium and oxygen followed by vacuum anneals led to an increase in the root-mean-square roughness from Rq 0.1-0.2 nm up to 3 nm. As a result, the probability of electron escape into vacuum decreased by half.
KW - NEGATIVE ELECTRON-AFFINITY
KW - EMISSION
UR - http://www.scopus.com/inward/record.url?scp=85046098344&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/993/1/012007
DO - 10.1088/1742-6596/993/1/012007
M3 - Conference article
AN - SCOPUS:85046098344
VL - 993
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012007
T2 - 19th Russian Youth Conference on Physics of Semiconductors and Nanostructures, Opto- and Nanoelectronics, RYCPS 2017
Y2 - 27 November 2017 through 1 December 2017
ER -
ID: 12916175