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Photoemission from p-GaAs(Cs,O) under transition from negative to positive electron affinity. / Protopopov, D. E.; Khoroshilov, V. S.; Zhuravlev, A. G. и др.

в: Journal of Physics: Conference Series, Том 1695, № 1, 012105, 28.12.2020.

Результаты исследований: Научные публикации в периодических изданияхстатья по материалам конференцииРецензирование

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Protopopov DE, Khoroshilov VS, Zhuravlev AG, Kazantsev DM, Alperovich VL. Photoemission from p-GaAs(Cs,O) under transition from negative to positive electron affinity. Journal of Physics: Conference Series. 2020 дек. 28;1695(1):012105. doi: 10.1088/1742-6596/1695/1/012105

Author

Protopopov, D. E. ; Khoroshilov, V. S. ; Zhuravlev, A. G. и др. / Photoemission from p-GaAs(Cs,O) under transition from negative to positive electron affinity. в: Journal of Physics: Conference Series. 2020 ; Том 1695, № 1.

BibTeX

@article{1c781f88e0fb42cab5a01d2803e082fd,
title = "Photoemission from p-GaAs(Cs,O) under transition from negative to positive electron affinity",
abstract = "The evolution of the electron escape probability from p-GaAs(Cs, O) to vacuum was measured under the transition from the state of negative to the state of positive electron affinity. The transition was induced by the deposition of excess cesium or oxygen on the p-GaAs(Cs, O) surface activated to the state of negative electron affinity. Under deposition of excess cesium, the escape probability was significantly lower as compared to excess oxygen, presumably, due to reflection and scattering of electrons on two-dimensional cesium metal clusters. Under Cs-induced transition, at positive values of affinity, a new peak was observed below the band gap in the photoemission quantum yield spectra. The peak stems, presumably, from: (i) the effective capture of sub-bandgap light in the structure, which consists of the heavily doped p +-GaAs epilayer grown on the semi-insulating GaAs substrate, due to diffuse backside reflection from the rough back surface of the substrate; (ii) absorption of the captured light near the emitting p +-GaAs surface due to the Franz-Keldysh effect in the strong surface electric field; (iii) emission of the electrons generated near the surface.",
author = "Protopopov, {D. E.} and Khoroshilov, {V. S.} and Zhuravlev, {A. G.} and Kazantsev, {D. M.} and Alperovich, {V. L.}",
note = "Funding Information: This work was supported by the Russian Foundation for Basic Research (grant 20-02-00355 А). Publisher Copyright: {\textcopyright} Published under licence by IOP Publishing Ltd. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 7th International School and Conference {"}SaintPetersburg OPEN 2020{"} on Optoelectronics, Photonics, Engineering and Nanostructures ; Conference date: 27-04-2020 Through 30-04-2020",
year = "2020",
month = dec,
day = "28",
doi = "10.1088/1742-6596/1695/1/012105",
language = "English",
volume = "1695",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "IOP Publishing Ltd.",
number = "1",

}

RIS

TY - JOUR

T1 - Photoemission from p-GaAs(Cs,O) under transition from negative to positive electron affinity

AU - Protopopov, D. E.

AU - Khoroshilov, V. S.

AU - Zhuravlev, A. G.

AU - Kazantsev, D. M.

AU - Alperovich, V. L.

N1 - Funding Information: This work was supported by the Russian Foundation for Basic Research (grant 20-02-00355 А). Publisher Copyright: © Published under licence by IOP Publishing Ltd. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.

PY - 2020/12/28

Y1 - 2020/12/28

N2 - The evolution of the electron escape probability from p-GaAs(Cs, O) to vacuum was measured under the transition from the state of negative to the state of positive electron affinity. The transition was induced by the deposition of excess cesium or oxygen on the p-GaAs(Cs, O) surface activated to the state of negative electron affinity. Under deposition of excess cesium, the escape probability was significantly lower as compared to excess oxygen, presumably, due to reflection and scattering of electrons on two-dimensional cesium metal clusters. Under Cs-induced transition, at positive values of affinity, a new peak was observed below the band gap in the photoemission quantum yield spectra. The peak stems, presumably, from: (i) the effective capture of sub-bandgap light in the structure, which consists of the heavily doped p +-GaAs epilayer grown on the semi-insulating GaAs substrate, due to diffuse backside reflection from the rough back surface of the substrate; (ii) absorption of the captured light near the emitting p +-GaAs surface due to the Franz-Keldysh effect in the strong surface electric field; (iii) emission of the electrons generated near the surface.

AB - The evolution of the electron escape probability from p-GaAs(Cs, O) to vacuum was measured under the transition from the state of negative to the state of positive electron affinity. The transition was induced by the deposition of excess cesium or oxygen on the p-GaAs(Cs, O) surface activated to the state of negative electron affinity. Under deposition of excess cesium, the escape probability was significantly lower as compared to excess oxygen, presumably, due to reflection and scattering of electrons on two-dimensional cesium metal clusters. Under Cs-induced transition, at positive values of affinity, a new peak was observed below the band gap in the photoemission quantum yield spectra. The peak stems, presumably, from: (i) the effective capture of sub-bandgap light in the structure, which consists of the heavily doped p +-GaAs epilayer grown on the semi-insulating GaAs substrate, due to diffuse backside reflection from the rough back surface of the substrate; (ii) absorption of the captured light near the emitting p +-GaAs surface due to the Franz-Keldysh effect in the strong surface electric field; (iii) emission of the electrons generated near the surface.

UR - http://www.scopus.com/inward/record.url?scp=85098849059&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1695/1/012105

DO - 10.1088/1742-6596/1695/1/012105

M3 - Conference article

AN - SCOPUS:85098849059

VL - 1695

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012105

T2 - 7th International School and Conference "SaintPetersburg OPEN 2020" on Optoelectronics, Photonics, Engineering and Nanostructures

Y2 - 27 April 2020 through 30 April 2020

ER -

ID: 27372131