Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Optimization of The Thickness of Single-Layer Antireflection SiO2 Coating on a Silicon Photodiode Depending of the Characteristics of Incident Light. / Timofeev, A. V.; Mil’shtein, A. I.; Grigor’ev, D. N.
в: Optoelectronics, Instrumentation and Data Processing, Том 59, № 5, 10.2023, стр. 612-619.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Optimization of The Thickness of Single-Layer Antireflection SiO2 Coating on a Silicon Photodiode Depending of the Characteristics of Incident Light
AU - Timofeev, A. V.
AU - Mil’shtein, A. I.
AU - Grigor’ev, D. N.
N1 - This work was supported by ongoing institutional funding. No additional grants to carry out or direct this particular research were obtained. Публикация для корректировки.
PY - 2023/10
Y1 - 2023/10
N2 - Theoretical investigations of the dependence of the optimal thickness of a one-layer antireflection SiO coating on a silicon photodiode on the characteristics of the light incident to the photodiode. It is shown that the optimal thickness of the one-layer antireflection SiO coating for different angular distributions of intensity increases the quantum efficiency of the photodiode by up to 1.1 times in comparison with the classical one-layer antireflection coating with a thickness, which is optimal in the case of the normal incidence of monochromatic light.
AB - Theoretical investigations of the dependence of the optimal thickness of a one-layer antireflection SiO coating on a silicon photodiode on the characteristics of the light incident to the photodiode. It is shown that the optimal thickness of the one-layer antireflection SiO coating for different angular distributions of intensity increases the quantum efficiency of the photodiode by up to 1.1 times in comparison with the classical one-layer antireflection coating with a thickness, which is optimal in the case of the normal incidence of monochromatic light.
KW - antireflection coating
KW - photodiode
KW - reflection coefficient
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85187240784&origin=inward&txGid=9986577d445070a0c9930521996c1514
UR - https://www.mendeley.com/catalogue/3d0b9f4d-9561-3874-b361-39d629fdd4b6/
U2 - 10.3103/S8756699023050096
DO - 10.3103/S8756699023050096
M3 - Article
VL - 59
SP - 612
EP - 619
JO - Optoelectronics, Instrumentation and Data Processing
JF - Optoelectronics, Instrumentation and Data Processing
SN - 8756-6990
IS - 5
ER -
ID: 59780246