Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
IR Photoluminescence of Silicon Irradiated with High-Energy Xe Ions after Annealing. / Cherkova, S. G.; Volodin, V. A.; Skuratov, V. A. и др.
в: Optoelectronics, Instrumentation and Data Processing, Том 58, № 6, 2022, стр. 633-642.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - IR Photoluminescence of Silicon Irradiated with High-Energy Xe Ions after Annealing
AU - Cherkova, S. G.
AU - Volodin, V. A.
AU - Skuratov, V. A.
AU - Stoffel, M.
AU - Rinnert, H.
AU - Vergnat, M.
N1 - Публикация для корректировки.
PY - 2022
Y1 - 2022
N2 - The photoluminescence of high resistivity silicon irradiated with swift heavy xenon ions (167 MeV) is studied. In addition to the well-known X, W, (Formula presented.), and C lines, a broad band in the photoluminescence spectra is observed in the range of 1.3–1.5 μm at low temperatures. As the irradiation dose increases in the range of (Formula presented.), the intensity decreases and the photoluminescence bands narrow with a simultaneous shift of the maximum to the long wavelength range. The photoluminescence spectra change during subsequent annealings at temperatures of 400, 500, and (Formula presented.), which is associated with the transformation of the structure of defects in silicon. The temperature dependence of photoluminescence in the range from 10 to 170 K is studied for samples after irradiation with various doses and annealings.
AB - The photoluminescence of high resistivity silicon irradiated with swift heavy xenon ions (167 MeV) is studied. In addition to the well-known X, W, (Formula presented.), and C lines, a broad band in the photoluminescence spectra is observed in the range of 1.3–1.5 μm at low temperatures. As the irradiation dose increases in the range of (Formula presented.), the intensity decreases and the photoluminescence bands narrow with a simultaneous shift of the maximum to the long wavelength range. The photoluminescence spectra change during subsequent annealings at temperatures of 400, 500, and (Formula presented.), which is associated with the transformation of the structure of defects in silicon. The temperature dependence of photoluminescence in the range from 10 to 170 K is studied for samples after irradiation with various doses and annealings.
KW - defects in silicon
KW - photoluminescence
KW - swift heavy ions
UR - https://www.mendeley.com/catalogue/09078fce-721c-3f5b-9538-d858c5a9d941/
U2 - 10.3103/S8756699022060024
DO - 10.3103/S8756699022060024
M3 - Article
VL - 58
SP - 633
EP - 642
JO - Optoelectronics, Instrumentation and Data Processing
JF - Optoelectronics, Instrumentation and Data Processing
SN - 8756-6990
IS - 6
ER -
ID: 55694252