Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 –xCdхTe Films Grown Using Molecular Beam Epitaxy

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Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg_1 –_xCd_хTe Films Grown Using Molecular Beam Epitaxy. / Shvets, V. A.; Marin, D. V.; Yakushev, M. V. и др.

в: Optics and Spectroscopy, Том 129, № 1, 01.2021, стр. 29-36.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

BibTeX

@article{b646418912fa4b7784d82f535ed6fc36,

title = "Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 –xCdхTe Films Grown Using Molecular Beam Epitaxy",

abstract = "Based on in situ and ex situ ellipsometric measurements, the spectral dependences of the temperature sensitivity of the optical constants Hg1 – xCdхTe—dn(λ) and dk(λ) have been found for a series of samples of different compositions in the range from 0.160 to 0.327. The experiments were performed during cooling of the grown samples in a vacuum chamber. It has been found that the obtained dn and dk dependences can be well approximated by the sum of three Lorentz oscillators with the addition of the dispersion terms of the Cauchy formula. A parametric model that describes the sensitivities dn(λ) and dk(λ) for an arbitrary composition x in the specified range near the growth temperature has been proposed. Ex situ temperature measurements performed near room temperature correlate with the data of the high-temperature measurements. The results obtained are relevant for the development of ellipsometric control methods in situ of Hg1 – xCdхTe layer growth processes.",

keywords = "cadmium–mercury telluride, ellipsometry, molecular beam epitaxy, spectra of optical constants, temperature sensitivity",

author = "Shvets, {V. A.} and Marin, {D. V.} and Yakushev, {M. V.} and Rykhlitskii, {S. V.}",

note = "Funding Information: The work was performed within the framework of state tasks received from the Ministry of Education and Science (State contract No. 0306-2019-0004). Publisher Copyright: {\textcopyright} 2021, Pleiades Publishing, Ltd. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.",

year = "2021",

month = jan,

doi = "10.1134/S0030400X21010173",

language = "English",

volume = "129",

pages = "29--36",

journal = "Optics and Spectroscopy (English translation of Optika i Spektroskopiya)",

issn = "0030-400X",

publisher = "Maik Nauka Publishing / Springer SBM",

number = "1",

}

RIS

TY - JOUR

T1 - Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 –xCdхTe Films Grown Using Molecular Beam Epitaxy

AU - Shvets, V. A.

AU - Marin, D. V.

AU - Yakushev, M. V.

AU - Rykhlitskii, S. V.

N1 - Funding Information: The work was performed within the framework of state tasks received from the Ministry of Education and Science (State contract No. 0306-2019-0004). Publisher Copyright: © 2021, Pleiades Publishing, Ltd. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

PY - 2021/1

Y1 - 2021/1

N2 - Based on in situ and ex situ ellipsometric measurements, the spectral dependences of the temperature sensitivity of the optical constants Hg1 – xCdхTe—dn(λ) and dk(λ) have been found for a series of samples of different compositions in the range from 0.160 to 0.327. The experiments were performed during cooling of the grown samples in a vacuum chamber. It has been found that the obtained dn and dk dependences can be well approximated by the sum of three Lorentz oscillators with the addition of the dispersion terms of the Cauchy formula. A parametric model that describes the sensitivities dn(λ) and dk(λ) for an arbitrary composition x in the specified range near the growth temperature has been proposed. Ex situ temperature measurements performed near room temperature correlate with the data of the high-temperature measurements. The results obtained are relevant for the development of ellipsometric control methods in situ of Hg1 – xCdхTe layer growth processes.

AB - Based on in situ and ex situ ellipsometric measurements, the spectral dependences of the temperature sensitivity of the optical constants Hg1 – xCdхTe—dn(λ) and dk(λ) have been found for a series of samples of different compositions in the range from 0.160 to 0.327. The experiments were performed during cooling of the grown samples in a vacuum chamber. It has been found that the obtained dn and dk dependences can be well approximated by the sum of three Lorentz oscillators with the addition of the dispersion terms of the Cauchy formula. A parametric model that describes the sensitivities dn(λ) and dk(λ) for an arbitrary composition x in the specified range near the growth temperature has been proposed. Ex situ temperature measurements performed near room temperature correlate with the data of the high-temperature measurements. The results obtained are relevant for the development of ellipsometric control methods in situ of Hg1 – xCdхTe layer growth processes.

KW - cadmium–mercury telluride

KW - ellipsometry

KW - molecular beam epitaxy

KW - spectra of optical constants

KW - temperature sensitivity

UR - http://www.scopus.com/inward/record.url?scp=85104095806&partnerID=8YFLogxK

U2 - 10.1134/S0030400X21010173

DO - 10.1134/S0030400X21010173

M3 - Article

AN - SCOPUS:85104095806

VL - 129

SP - 29

EP - 36

JO - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

JF - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

SN - 0030-400X

IS - 1

ER -

ID: 28380925