Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions. / Shevchenko, Gleb V.; Bokhan, Petr A.; Kim, Vladimir A. и др.
International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2024. стр. 890-893 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
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TY - GEN
T1 - Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions
AU - Shevchenko, Gleb V.
AU - Bokhan, Petr A.
AU - Kim, Vladimir A.
AU - Zakrevsky, Dmitry E.
N1 - Conference code: 25
PY - 2024
Y1 - 2024
N2 - The efficiency of electron beam generation in an abnormal discharge with a cold cathode in helium under clean conditions under a direct current source supply is investigated. The range of measured pressures varies from 2.17 to 10.2 Torr and the voltages from 650 to 3300 V. An electron beam generation efficiency of ~66% was achieved at a discharge gap voltage of 3300 V and helium pressure of 2.17 Torr. Comparison of electron beam generation efficiency obtained under pure conditions with known literature data is presented and the same value of electron beam generation efficiency ~66% was demonstrated at shorter discharge gap lengths, lower voltages and higher pressures. It is shown that the electron beam generation efficiency increases under clean conditions. The high efficiency was explained using the effect of cathode modification by working gas (with subsequent change of emission properties of cold cathodes) and the falling part of the dependence of the Townsend electron multiplication factor on the reduced field strength at values greater than 800 Td. The obtained results are of interest for the developers of electron beam generators and allow increasing the energy efficiency of plasma devices.
AB - The efficiency of electron beam generation in an abnormal discharge with a cold cathode in helium under clean conditions under a direct current source supply is investigated. The range of measured pressures varies from 2.17 to 10.2 Torr and the voltages from 650 to 3300 V. An electron beam generation efficiency of ~66% was achieved at a discharge gap voltage of 3300 V and helium pressure of 2.17 Torr. Comparison of electron beam generation efficiency obtained under pure conditions with known literature data is presented and the same value of electron beam generation efficiency ~66% was demonstrated at shorter discharge gap lengths, lower voltages and higher pressures. It is shown that the electron beam generation efficiency increases under clean conditions. The high efficiency was explained using the effect of cathode modification by working gas (with subsequent change of emission properties of cold cathodes) and the falling part of the dependence of the Townsend electron multiplication factor on the reduced field strength at values greater than 800 Td. The obtained results are of interest for the developers of electron beam generators and allow increasing the energy efficiency of plasma devices.
KW - abnormal glow discharge
KW - clean conditions
KW - cold cathodes
KW - efficiency
KW - electron beams
KW - energy
KW - silicon carbide
KW - switches
KW - voltage
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85201977475&origin=inward&txGid=db107c888e888a102516af962a30a3b7
UR - https://www.mendeley.com/catalogue/209bdb2d-e6d9-3008-af06-12f990ce81d4/
U2 - 10.1109/EDM61683.2024.10615080
DO - 10.1109/EDM61683.2024.10615080
M3 - Conference contribution
SN - 9798350389234
T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
SP - 890
EP - 893
BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
PB - IEEE Computer Society
T2 - 25th IEEE International Conference of Young Professionals in Electron Devices and Materials
Y2 - 28 June 2024 through 2 July 2024
ER -
ID: 60548422