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Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions. / Shevchenko, Gleb V.; Bokhan, Petr A.; Kim, Vladimir A. et al.

International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2024. p. 890-893 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Harvard

Shevchenko, GV, Bokhan, PA, Kim, VA & Zakrevsky, DE 2024, Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions. in International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM, IEEE Computer Society, pp. 890-893, 25th IEEE International Conference of Young Professionals in Electron Devices and Materials, Russian Federation, 28.06.2024. https://doi.org/10.1109/EDM61683.2024.10615080

APA

Shevchenko, G. V., Bokhan, P. A., Kim, V. A., & Zakrevsky, D. E. (2024). Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions. In International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM (pp. 890-893). (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). IEEE Computer Society. https://doi.org/10.1109/EDM61683.2024.10615080

Vancouver

Shevchenko GV, Bokhan PA, Kim VA, Zakrevsky DE. Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions. In International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society. 2024. p. 890-893. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). doi: 10.1109/EDM61683.2024.10615080

Author

Shevchenko, Gleb V. ; Bokhan, Petr A. ; Kim, Vladimir A. et al. / Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2024. pp. 890-893 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

BibTeX

@inproceedings{fe8dd9a475784a1ebfeadd78f37d59fe,
title = "Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions",
abstract = "The efficiency of electron beam generation in an abnormal discharge with a cold cathode in helium under clean conditions under a direct current source supply is investigated. The range of measured pressures varies from 2.17 to 10.2 Torr and the voltages from 650 to 3300 V. An electron beam generation efficiency of ~66% was achieved at a discharge gap voltage of 3300 V and helium pressure of 2.17 Torr. Comparison of electron beam generation efficiency obtained under pure conditions with known literature data is presented and the same value of electron beam generation efficiency ~66% was demonstrated at shorter discharge gap lengths, lower voltages and higher pressures. It is shown that the electron beam generation efficiency increases under clean conditions. The high efficiency was explained using the effect of cathode modification by working gas (with subsequent change of emission properties of cold cathodes) and the falling part of the dependence of the Townsend electron multiplication factor on the reduced field strength at values greater than 800 Td. The obtained results are of interest for the developers of electron beam generators and allow increasing the energy efficiency of plasma devices.",
keywords = "abnormal glow discharge, clean conditions, cold cathodes, efficiency, electron beams, energy, silicon carbide, switches, voltage",
author = "Shevchenko, {Gleb V.} and Bokhan, {Petr A.} and Kim, {Vladimir A.} and Zakrevsky, {Dmitry E.}",
note = "The work was supported by Russian Science Foundation, project № 24-19-00037 (https://rscf.ru/project/24-19-00037/).; 25th IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2024 ; Conference date: 28-06-2024 Through 02-07-2024",
year = "2024",
doi = "10.1109/EDM61683.2024.10615080",
language = "English",
isbn = "9798350389234",
series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
publisher = "IEEE Computer Society",
pages = "890--893",
booktitle = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
address = "United States",
url = "https://edm.ieeesiberia.org/",

}

RIS

TY - GEN

T1 - Investigation of the Electron Beam Generation Efficiency in an Abnormal Glow Discharge in Helium under Pure Conditions

AU - Shevchenko, Gleb V.

AU - Bokhan, Petr A.

AU - Kim, Vladimir A.

AU - Zakrevsky, Dmitry E.

N1 - Conference code: 25

PY - 2024

Y1 - 2024

N2 - The efficiency of electron beam generation in an abnormal discharge with a cold cathode in helium under clean conditions under a direct current source supply is investigated. The range of measured pressures varies from 2.17 to 10.2 Torr and the voltages from 650 to 3300 V. An electron beam generation efficiency of ~66% was achieved at a discharge gap voltage of 3300 V and helium pressure of 2.17 Torr. Comparison of electron beam generation efficiency obtained under pure conditions with known literature data is presented and the same value of electron beam generation efficiency ~66% was demonstrated at shorter discharge gap lengths, lower voltages and higher pressures. It is shown that the electron beam generation efficiency increases under clean conditions. The high efficiency was explained using the effect of cathode modification by working gas (with subsequent change of emission properties of cold cathodes) and the falling part of the dependence of the Townsend electron multiplication factor on the reduced field strength at values greater than 800 Td. The obtained results are of interest for the developers of electron beam generators and allow increasing the energy efficiency of plasma devices.

AB - The efficiency of electron beam generation in an abnormal discharge with a cold cathode in helium under clean conditions under a direct current source supply is investigated. The range of measured pressures varies from 2.17 to 10.2 Torr and the voltages from 650 to 3300 V. An electron beam generation efficiency of ~66% was achieved at a discharge gap voltage of 3300 V and helium pressure of 2.17 Torr. Comparison of electron beam generation efficiency obtained under pure conditions with known literature data is presented and the same value of electron beam generation efficiency ~66% was demonstrated at shorter discharge gap lengths, lower voltages and higher pressures. It is shown that the electron beam generation efficiency increases under clean conditions. The high efficiency was explained using the effect of cathode modification by working gas (with subsequent change of emission properties of cold cathodes) and the falling part of the dependence of the Townsend electron multiplication factor on the reduced field strength at values greater than 800 Td. The obtained results are of interest for the developers of electron beam generators and allow increasing the energy efficiency of plasma devices.

KW - abnormal glow discharge

KW - clean conditions

KW - cold cathodes

KW - efficiency

KW - electron beams

KW - energy

KW - silicon carbide

KW - switches

KW - voltage

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85201977475&origin=inward&txGid=db107c888e888a102516af962a30a3b7

UR - https://www.mendeley.com/catalogue/209bdb2d-e6d9-3008-af06-12f990ce81d4/

U2 - 10.1109/EDM61683.2024.10615080

DO - 10.1109/EDM61683.2024.10615080

M3 - Conference contribution

SN - 9798350389234

T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

SP - 890

EP - 893

BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

PB - IEEE Computer Society

T2 - 25th IEEE International Conference of Young Professionals in Electron Devices and Materials

Y2 - 28 June 2024 through 2 July 2024

ER -

ID: 60548422