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Influence of a silicon impurity on growth of diamond crystals in the Mg-C system. / Khokhryakov, Alexander F.; Palyanov, Yuri N.; Borzdov, Yuri M. и др.
в: Diamond and Related Materials, Том 87, 01.08.2018, стр. 27-34.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Influence of a silicon impurity on growth of diamond crystals in the Mg-C system
AU - Khokhryakov, Alexander F.
AU - Palyanov, Yuri N.
AU - Borzdov, Yuri M.
AU - Kozhukhov, Anton S.
AU - Sheglov, Dmitriy V.
PY - 2018/8/1
Y1 - 2018/8/1
N2 - This article reports a study of the morphology of diamond crystals grown at 7.0 GPa and 1800 °C in the Mg-C system with the addition of silicon in an amount of 0.5 wt%. Step patterns on {111} and {100} faces were studied in a wide range of magnifications using optical microscopy (DIC), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Morphological studies revealed that a reduction in the growth rate and a change in the morphological significance of the {100} and {111} faces were associated with adsorption of a mobile impurity (silicon) leading to poisoning of kinks and (or) steps. This leads to roughing of the faces and formation of macrosteps as well as 2D and 3D nucleation islands. At a silicon concentration of 1.0 wt% or more, immobile impurity particles are apparently formed on macrostep terraces, and growth inhibition occurs according to the Cabrera-Vermilyea model.
AB - This article reports a study of the morphology of diamond crystals grown at 7.0 GPa and 1800 °C in the Mg-C system with the addition of silicon in an amount of 0.5 wt%. Step patterns on {111} and {100} faces were studied in a wide range of magnifications using optical microscopy (DIC), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Morphological studies revealed that a reduction in the growth rate and a change in the morphological significance of the {100} and {111} faces were associated with adsorption of a mobile impurity (silicon) leading to poisoning of kinks and (or) steps. This leads to roughing of the faces and formation of macrosteps as well as 2D and 3D nucleation islands. At a silicon concentration of 1.0 wt% or more, immobile impurity particles are apparently formed on macrostep terraces, and growth inhibition occurs according to the Cabrera-Vermilyea model.
KW - High pressure high temperature (HTHP)
KW - Impurity adsorption
KW - Morphology
KW - Surface microscopy
KW - Synthetic diamond
KW - HIGH-PRESSURE
KW - 100 FACES
KW - AQUEOUS-SOLUTION
KW - SURFACES
UR - http://www.scopus.com/inward/record.url?scp=85046992959&partnerID=8YFLogxK
U2 - 10.1016/j.diamond.2018.05.006
DO - 10.1016/j.diamond.2018.05.006
M3 - Article
AN - SCOPUS:85046992959
VL - 87
SP - 27
EP - 34
JO - Diamond and Related Materials
JF - Diamond and Related Materials
SN - 0925-9635
ER -
ID: 13468870