TY - JOUR

T1 - Highly Sensitive Express Nonlinear Optical Diagnostics of the Crystalline State of Heterostructures Such as Sphalerite

AU - Stupak, M. F.

AU - Mikhailov, N. N.

AU - Dvoretsky, S. A.

AU - Makarov, S. N.

AU - Yelesin, A. G.

AU - Verhoglyad, A. G.

N1 - The work was partially supported by the Russian Foundation for Fundamental Research (project no. 18-29-20053), Volkswagen Stiftung Program (no. 97738), and as part of the state assignment of the Russian Federal Ministry of Education and Science in terms of project no. AAAAA20-120102190007-5.

PY - 2024/2

Y1 - 2024/2

N2 - The characteristics of a highly sensitive express bench for nonlinear optical diagnosis of crystalline structures such as sphalerite by generation of the second harmonica are presented. The analysis of the possibilities of quantitative and qualitative characterization of the features of the crystalline parameters of the layers of heteroepitaxial structures CdxHg1 –xTe on substrates from GaAs with orientation (013) was carried out. The results were obtained by deviations of orientation in layers from the orientation of the substrate, which arose during the epitaxy, to determine the existence of stresses. The high sensitivity of the bench revealed the presence/absence of micro-particles with a disordered crystalline structure. Experimental results of reversible modification of the “in situ” crystalline state of CdxHg1 –xTe structures with short-term local radiation exposure of high power laser radiation are given. New experimental data have been presented showing that the components of the nonlineaic susceptibility tensor χxyz(ω) of the crystalline structure of CdxHg1 –xTe depend on composition and are an order of magnitude larger than similar components of tensor in CdTe and GaAs.

AB - The characteristics of a highly sensitive express bench for nonlinear optical diagnosis of crystalline structures such as sphalerite by generation of the second harmonica are presented. The analysis of the possibilities of quantitative and qualitative characterization of the features of the crystalline parameters of the layers of heteroepitaxial structures CdxHg1 –xTe on substrates from GaAs with orientation (013) was carried out. The results were obtained by deviations of orientation in layers from the orientation of the substrate, which arose during the epitaxy, to determine the existence of stresses. The high sensitivity of the bench revealed the presence/absence of micro-particles with a disordered crystalline structure. Experimental results of reversible modification of the “in situ” crystalline state of CdxHg1 –xTe structures with short-term local radiation exposure of high power laser radiation are given. New experimental data have been presented showing that the components of the nonlineaic susceptibility tensor χxyz(ω) of the crystalline structure of CdxHg1 –xTe depend on composition and are an order of magnitude larger than similar components of tensor in CdTe and GaAs.

KW - azimuth angular dependence

KW - heterostructures CdxHg1 –xTe

KW - microparticle

KW - radiation heating

KW - second harmonica

KW - sphalerite crystals

KW - tensions

KW - tensor of nonlinear susceptibility

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85202968405&origin=inward&txGid=a8339dfab8e9931e38ec59b56620bc12

UR - https://elibrary.ru/item.asp?id=69095202

UR - https://www.mendeley.com/catalogue/ad058dd7-c8d3-3b55-8159-266440f30ff3/

U2 - 10.1134/S1063784224010389

DO - 10.1134/S1063784224010389

M3 - Article

VL - 69

SP - 404

EP - 413

JO - Technical Physics

JF - Technical Physics

SN - 1063-7842

IS - 2

M1 - 38

ER -