Standard

Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics. / Shavit, Michal; Shytov, Andrey; Falkovich, Gregory.

в: Physical Review Letters, Том 123, № 2, 026801, 09.07.2019, стр. 026801.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

Harvard

Shavit, M, Shytov, A & Falkovich, G 2019, 'Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics', Physical Review Letters, Том. 123, № 2, 026801, стр. 026801. https://doi.org/10.1103/PhysRevLett.123.026801

APA

Shavit, M., Shytov, A., & Falkovich, G. (2019). Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics. Physical Review Letters, 123(2), 026801. [026801]. https://doi.org/10.1103/PhysRevLett.123.026801

Vancouver

Shavit M, Shytov A, Falkovich G. Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics. Physical Review Letters. 2019 июль 9;123(2):026801. 026801. doi: 10.1103/PhysRevLett.123.026801

Author

Shavit, Michal ; Shytov, Andrey ; Falkovich, Gregory. / Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics. в: Physical Review Letters. 2019 ; Том 123, № 2. стр. 026801.

BibTeX

@article{f1c47382803e4604a34f9402d150049d,
title = "Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics",
abstract = "Electronic fluids bring into hydrodynamics a new setting: equipotential flow sources embedded inside the fluid. Here we show that the nonlocal relation between the current and electric field due to momentum-conserving interparticle collisions leads to a total or partial field expulsion from such flows. That results in freely flowing currents in the bulk and a boundary jump in the electric potential at current-injecting electrodes. We derive a new type of boundary conditions, appropriate for the case. We then analyze current distribution in free flows, discuss how the field expulsion depends upon the geometry of the electrode, and link the phenomenon to the breakdown of conformal invariance.",
keywords = "RESISTANCE",
author = "Michal Shavit and Andrey Shytov and Gregory Falkovich",
note = "Publisher Copyright: {\textcopyright} 2019 American Physical Society.",
year = "2019",
month = jul,
day = "9",
doi = "10.1103/PhysRevLett.123.026801",
language = "English",
volume = "123",
pages = "026801",
journal = "Physical Review Letters",
issn = "0031-9007",
publisher = "American Physical Society",
number = "2",

}

RIS

TY - JOUR

T1 - Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics

AU - Shavit, Michal

AU - Shytov, Andrey

AU - Falkovich, Gregory

N1 - Publisher Copyright: © 2019 American Physical Society.

PY - 2019/7/9

Y1 - 2019/7/9

N2 - Electronic fluids bring into hydrodynamics a new setting: equipotential flow sources embedded inside the fluid. Here we show that the nonlocal relation between the current and electric field due to momentum-conserving interparticle collisions leads to a total or partial field expulsion from such flows. That results in freely flowing currents in the bulk and a boundary jump in the electric potential at current-injecting electrodes. We derive a new type of boundary conditions, appropriate for the case. We then analyze current distribution in free flows, discuss how the field expulsion depends upon the geometry of the electrode, and link the phenomenon to the breakdown of conformal invariance.

AB - Electronic fluids bring into hydrodynamics a new setting: equipotential flow sources embedded inside the fluid. Here we show that the nonlocal relation between the current and electric field due to momentum-conserving interparticle collisions leads to a total or partial field expulsion from such flows. That results in freely flowing currents in the bulk and a boundary jump in the electric potential at current-injecting electrodes. We derive a new type of boundary conditions, appropriate for the case. We then analyze current distribution in free flows, discuss how the field expulsion depends upon the geometry of the electrode, and link the phenomenon to the breakdown of conformal invariance.

KW - RESISTANCE

UR - http://www.scopus.com/inward/record.url?scp=85069898012&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.123.026801

DO - 10.1103/PhysRevLett.123.026801

M3 - Article

C2 - 31386495

AN - SCOPUS:85069898012

VL - 123

SP - 026801

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 2

M1 - 026801

ER -

ID: 21145881