Research output: Contribution to journal › Article › peer-review
Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics. / Shavit, Michal; Shytov, Andrey; Falkovich, Gregory.
In: Physical Review Letters, Vol. 123, No. 2, 026801, 09.07.2019, p. 026801.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Freely Flowing Currents and Electric Field Expulsion in Viscous Electronics
AU - Shavit, Michal
AU - Shytov, Andrey
AU - Falkovich, Gregory
N1 - Publisher Copyright: © 2019 American Physical Society.
PY - 2019/7/9
Y1 - 2019/7/9
N2 - Electronic fluids bring into hydrodynamics a new setting: equipotential flow sources embedded inside the fluid. Here we show that the nonlocal relation between the current and electric field due to momentum-conserving interparticle collisions leads to a total or partial field expulsion from such flows. That results in freely flowing currents in the bulk and a boundary jump in the electric potential at current-injecting electrodes. We derive a new type of boundary conditions, appropriate for the case. We then analyze current distribution in free flows, discuss how the field expulsion depends upon the geometry of the electrode, and link the phenomenon to the breakdown of conformal invariance.
AB - Electronic fluids bring into hydrodynamics a new setting: equipotential flow sources embedded inside the fluid. Here we show that the nonlocal relation between the current and electric field due to momentum-conserving interparticle collisions leads to a total or partial field expulsion from such flows. That results in freely flowing currents in the bulk and a boundary jump in the electric potential at current-injecting electrodes. We derive a new type of boundary conditions, appropriate for the case. We then analyze current distribution in free flows, discuss how the field expulsion depends upon the geometry of the electrode, and link the phenomenon to the breakdown of conformal invariance.
KW - RESISTANCE
UR - http://www.scopus.com/inward/record.url?scp=85069898012&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.123.026801
DO - 10.1103/PhysRevLett.123.026801
M3 - Article
C2 - 31386495
AN - SCOPUS:85069898012
VL - 123
SP - 026801
JO - Physical Review Letters
JF - Physical Review Letters
SN - 0031-9007
IS - 2
M1 - 026801
ER -
ID: 21145881