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Evolution of the transverse and longitudinal energy distributions of electrons emitted from a GaAsP photocathode as a function of its degradation state. / Jones, L. B.; Scheibler, H. E.; Gorshkov, D. V. и др.

в: Journal of Applied Physics, Том 121, № 22, 225703, 14.06.2017.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

Harvard

Jones, LB, Scheibler, HE, Gorshkov, DV, Terekhov, AS, Militsyn, BL & Noakes, TCQ 2017, 'Evolution of the transverse and longitudinal energy distributions of electrons emitted from a GaAsP photocathode as a function of its degradation state', Journal of Applied Physics, Том. 121, № 22, 225703. https://doi.org/10.1063/1.4984603

APA

Jones, L. B., Scheibler, H. E., Gorshkov, D. V., Terekhov, A. S., Militsyn, B. L., & Noakes, T. C. Q. (2017). Evolution of the transverse and longitudinal energy distributions of electrons emitted from a GaAsP photocathode as a function of its degradation state. Journal of Applied Physics, 121(22), [225703]. https://doi.org/10.1063/1.4984603

Vancouver

Jones LB, Scheibler HE, Gorshkov DV, Terekhov AS, Militsyn BL, Noakes TCQ. Evolution of the transverse and longitudinal energy distributions of electrons emitted from a GaAsP photocathode as a function of its degradation state. Journal of Applied Physics. 2017 июнь 14;121(22):225703. doi: 10.1063/1.4984603

Author

BibTeX

@article{199669dc55de49b786500c20f4e70d45,
title = "Evolution of the transverse and longitudinal energy distributions of electrons emitted from a GaAsP photocathode as a function of its degradation state",
abstract = "We present measurements of the transverse and longitudinal energy spread of photoelectrons emitted from a GaAsP photocathode as a function of its degradation state. The cathode was initially activated to a state of negative electron affinity in our photocathode preparation facility, achieving a quantum efficiency of 3% at a wavelength of 532 nm. It was then transferred under XHV conditions to our transverse energy spread spectrometer, where energy spread measurements were made while the photocathode was progressively degraded through a controlled exposure to oxygen. Data have been collected under photocathode illumination at 532 nm, and the changing photoelectron energy distribution associated with the changes in the level of electron affinity due to quantum efficiency degradation through an exposure to 0.25 L of oxygen has been demonstrated. Our experiments have shown that GaAsP boasts a significantly higher resilience to degradation under exposure to oxygen than a GaAs photocathode, though it does exhibit a higher level of mean transverse energy. Coupled with the favourable published data on GaAsP photoemission response times, we conclude that GaAsP is a viable candidate material as a particle accelerator electron source.",
keywords = "GAAS1-XPX ALLOYS, AFFINITY",
author = "Jones, {L. B.} and Scheibler, {H. E.} and Gorshkov, {D. V.} and Terekhov, {A. S.} and Militsyn, {B. L.} and Noakes, {T. C.Q.}",
year = "2017",
month = jun,
day = "14",
doi = "10.1063/1.4984603",
language = "English",
volume = "121",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "AMER INST PHYSICS",
number = "22",

}

RIS

TY - JOUR

T1 - Evolution of the transverse and longitudinal energy distributions of electrons emitted from a GaAsP photocathode as a function of its degradation state

AU - Jones, L. B.

AU - Scheibler, H. E.

AU - Gorshkov, D. V.

AU - Terekhov, A. S.

AU - Militsyn, B. L.

AU - Noakes, T. C.Q.

PY - 2017/6/14

Y1 - 2017/6/14

N2 - We present measurements of the transverse and longitudinal energy spread of photoelectrons emitted from a GaAsP photocathode as a function of its degradation state. The cathode was initially activated to a state of negative electron affinity in our photocathode preparation facility, achieving a quantum efficiency of 3% at a wavelength of 532 nm. It was then transferred under XHV conditions to our transverse energy spread spectrometer, where energy spread measurements were made while the photocathode was progressively degraded through a controlled exposure to oxygen. Data have been collected under photocathode illumination at 532 nm, and the changing photoelectron energy distribution associated with the changes in the level of electron affinity due to quantum efficiency degradation through an exposure to 0.25 L of oxygen has been demonstrated. Our experiments have shown that GaAsP boasts a significantly higher resilience to degradation under exposure to oxygen than a GaAs photocathode, though it does exhibit a higher level of mean transverse energy. Coupled with the favourable published data on GaAsP photoemission response times, we conclude that GaAsP is a viable candidate material as a particle accelerator electron source.

AB - We present measurements of the transverse and longitudinal energy spread of photoelectrons emitted from a GaAsP photocathode as a function of its degradation state. The cathode was initially activated to a state of negative electron affinity in our photocathode preparation facility, achieving a quantum efficiency of 3% at a wavelength of 532 nm. It was then transferred under XHV conditions to our transverse energy spread spectrometer, where energy spread measurements were made while the photocathode was progressively degraded through a controlled exposure to oxygen. Data have been collected under photocathode illumination at 532 nm, and the changing photoelectron energy distribution associated with the changes in the level of electron affinity due to quantum efficiency degradation through an exposure to 0.25 L of oxygen has been demonstrated. Our experiments have shown that GaAsP boasts a significantly higher resilience to degradation under exposure to oxygen than a GaAs photocathode, though it does exhibit a higher level of mean transverse energy. Coupled with the favourable published data on GaAsP photoemission response times, we conclude that GaAsP is a viable candidate material as a particle accelerator electron source.

KW - GAAS1-XPX ALLOYS

KW - AFFINITY

UR - http://www.scopus.com/inward/record.url?scp=85020736763&partnerID=8YFLogxK

U2 - 10.1063/1.4984603

DO - 10.1063/1.4984603

M3 - Article

AN - SCOPUS:85020736763

VL - 121

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 22

M1 - 225703

ER -

ID: 10184090