Consideration of the Sample Eccentricity in the Measurement of Unit Cell Parameters of Small Single Crystals in Bond’s Scheme Implemented in Modern Diffractometers

Standard

Consideration of the Sample Eccentricity in the Measurement of Unit Cell Parameters of Small Single Crystals in Bond’s Scheme Implemented in Modern Diffractometers. / Kudryavtsev, A. L.; Gromilov, S. A.

в: Journal of Structural Chemistry, Том 65, № 12, 27.12.2024, стр. 2466-2477.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

BibTeX

@article{46b4d532d6d44975a7c5a0c34e961ca1,

title = "Consideration of the Sample Eccentricity in the Measurement of Unit Cell Parameters of Small Single Crystals in Bond{\textquoteright}s Scheme Implemented in Modern Diffractometers",

abstract = "Abstract: We discuss the methodological questions of measuring unit cell parameters of small crystals in Bond{\textquoteright}s scheme on a commercial diffractometer equipped with a three-circle goniometer and a 2D detector. The effect of the sample eccentricity on the positions of X-ray diffraction reflections during rotation about φ and ω axes is examined. The approach is developed to eliminate the effect of the sample eccentricity related to rotation about the φ axis by positioning one of the crystallographic directions along the ω axis. The unit cell parameters are measured for the reference Si and Ge single crystals used in this work with relative error Δa/a no worse than 6.5·10–5.",

keywords = "2D detector, Bond{\textquoteright}s scheme, accuracy, eccentricity, reference, single crystal X-ray diffraction, small crystals, unit cell parameters, 2D detector, accuracy, Bond{\textquoteright}s scheme, eccentricity, reference, single crystal X-ray diffraction, small crystals, unit cell parameters",

author = "Kudryavtsev, {A. L.} and Gromilov, {S. A.}",

note = "Финансирование: Russian Science Foundation RSF 24-22-20017",

year = "2024",

month = dec,

day = "27",

doi = "10.1134/S0022476624120102",

language = "English",

volume = "65",

pages = "2466--2477",

journal = "Journal of Structural Chemistry",

issn = "0022-4766",

publisher = "Springer GmbH & Co, Auslieferungs-Gesellschaf",

number = "12",

}

RIS

TY - JOUR

T1 - Consideration of the Sample Eccentricity in the Measurement of Unit Cell Parameters of Small Single Crystals in Bond’s Scheme Implemented in Modern Diffractometers

AU - Kudryavtsev, A. L.

AU - Gromilov, S. A.

N1 - Финансирование: Russian Science Foundation RSF 24-22-20017

PY - 2024/12/27

Y1 - 2024/12/27

N2 - Abstract: We discuss the methodological questions of measuring unit cell parameters of small crystals in Bond’s scheme on a commercial diffractometer equipped with a three-circle goniometer and a 2D detector. The effect of the sample eccentricity on the positions of X-ray diffraction reflections during rotation about φ and ω axes is examined. The approach is developed to eliminate the effect of the sample eccentricity related to rotation about the φ axis by positioning one of the crystallographic directions along the ω axis. The unit cell parameters are measured for the reference Si and Ge single crystals used in this work with relative error Δa/a no worse than 6.5·10–5.

AB - Abstract: We discuss the methodological questions of measuring unit cell parameters of small crystals in Bond’s scheme on a commercial diffractometer equipped with a three-circle goniometer and a 2D detector. The effect of the sample eccentricity on the positions of X-ray diffraction reflections during rotation about φ and ω axes is examined. The approach is developed to eliminate the effect of the sample eccentricity related to rotation about the φ axis by positioning one of the crystallographic directions along the ω axis. The unit cell parameters are measured for the reference Si and Ge single crystals used in this work with relative error Δa/a no worse than 6.5·10–5.

KW - 2D detector

KW - Bond’s scheme

KW - accuracy

KW - eccentricity

KW - reference

KW - single crystal X-ray diffraction

KW - small crystals

KW - unit cell parameters

KW - 2D detector

KW - accuracy

KW - Bond’s scheme

KW - eccentricity

KW - reference

KW - single crystal X-ray diffraction

KW - small crystals

KW - unit cell parameters

UR - https://www.mendeley.com/catalogue/5a28a885-4e62-319e-b351-bc0517a4b890/

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85213202630&origin=inward&txGid=cc3fc8d9834390f9c710f61ad03c1f40

U2 - 10.1134/S0022476624120102

DO - 10.1134/S0022476624120102

M3 - Article

VL - 65

SP - 2466

EP - 2477

JO - Journal of Structural Chemistry

JF - Journal of Structural Chemistry

SN - 0022-4766

IS - 12

ER -

ID: 61415761