Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Using Algorithmic Complexity Metrics for Process-Oriented Specifications. / Abramenko, Artyom; Zyubin, Vladimir.
International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. p. 1430-1434 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
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TY - GEN
T1 - Using Algorithmic Complexity Metrics for Process-Oriented Specifications
AU - Abramenko, Artyom
AU - Zyubin, Vladimir
N1 - Conference code: 26
PY - 2025/8/8
Y1 - 2025/8/8
N2 - In industrial automation software development, software cost, complexity and functionality play a key role. The purpose of this paper is to consider the problem of algorithmic complexity assessment in the context of process-oriented programming languages. Metrics and algorithms for assessing algorithmic complexity are well developed for general-purpose languages, but they are not entirely suitable for control programs that are written in specialized problem-oriented languages, like poST. Therefore, maintainability and readability of programs is one of the main parameters used in assessing the safety of process control programs, and in this regard, the task of developing and implementing static analysis tools for such languages is relevant. The paper focuses on the development and implementation of effective methods and tools for static analysis of programs written in the poST language. The paper leverages the process of code analysis and optimization. Section I serves as an introduction to the subject area. Section II overviews the existing approaches for algorithmic analysis of source code and introduces the process-oriented paradigm. Section III describes the proposed methods for complexity analysis. Section IV describes the implementation of the proposed approach in the form of an Eclipse based IDE. Section V presents the results of case studies.
AB - In industrial automation software development, software cost, complexity and functionality play a key role. The purpose of this paper is to consider the problem of algorithmic complexity assessment in the context of process-oriented programming languages. Metrics and algorithms for assessing algorithmic complexity are well developed for general-purpose languages, but they are not entirely suitable for control programs that are written in specialized problem-oriented languages, like poST. Therefore, maintainability and readability of programs is one of the main parameters used in assessing the safety of process control programs, and in this regard, the task of developing and implementing static analysis tools for such languages is relevant. The paper focuses on the development and implementation of effective methods and tools for static analysis of programs written in the poST language. The paper leverages the process of code analysis and optimization. Section I serves as an introduction to the subject area. Section II overviews the existing approaches for algorithmic analysis of source code and introduces the process-oriented paradigm. Section III describes the proposed methods for complexity analysis. Section IV describes the implementation of the proposed approach in the form of an Eclipse based IDE. Section V presents the results of case studies.
KW - algorithmic complexity
KW - control software specification
KW - poST
KW - process-oriented programming
KW - static analysis
UR - https://www.scopus.com/pages/publications/105014157376
UR - https://www.mendeley.com/catalogue/f46d6a87-1054-3a93-89c8-610621288a97/
U2 - 10.1109/EDM65517.2025.11096883
DO - 10.1109/EDM65517.2025.11096883
M3 - Conference contribution
SN - 9781665477376
T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
SP - 1430
EP - 1434
BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
PB - IEEE Computer Society
T2 - 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Y2 - 27 June 2025 through 1 July 2025
ER -
ID: 68938119