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Using Algorithmic Complexity Metrics for Process-Oriented Specifications. / Abramenko, Artyom; Zyubin, Vladimir.

International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. p. 1430-1434 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Harvard

Abramenko, A & Zyubin, V 2025, Using Algorithmic Complexity Metrics for Process-Oriented Specifications. in International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM, IEEE Computer Society, pp. 1430-1434, 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM), Алтай, Russian Federation, 27.06.2025. https://doi.org/10.1109/EDM65517.2025.11096883

APA

Abramenko, A., & Zyubin, V. (2025). Using Algorithmic Complexity Metrics for Process-Oriented Specifications. In International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM (pp. 1430-1434). (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). IEEE Computer Society. https://doi.org/10.1109/EDM65517.2025.11096883

Vancouver

Abramenko A, Zyubin V. Using Algorithmic Complexity Metrics for Process-Oriented Specifications. In International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society. 2025. p. 1430-1434. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). doi: 10.1109/EDM65517.2025.11096883

Author

Abramenko, Artyom ; Zyubin, Vladimir. / Using Algorithmic Complexity Metrics for Process-Oriented Specifications. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. pp. 1430-1434 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

BibTeX

@inproceedings{e26387d2090f42e587deb30ebf9306fd,
title = "Using Algorithmic Complexity Metrics for Process-Oriented Specifications",
abstract = "In industrial automation software development, software cost, complexity and functionality play a key role. The purpose of this paper is to consider the problem of algorithmic complexity assessment in the context of process-oriented programming languages. Metrics and algorithms for assessing algorithmic complexity are well developed for general-purpose languages, but they are not entirely suitable for control programs that are written in specialized problem-oriented languages, like poST. Therefore, maintainability and readability of programs is one of the main parameters used in assessing the safety of process control programs, and in this regard, the task of developing and implementing static analysis tools for such languages is relevant. The paper focuses on the development and implementation of effective methods and tools for static analysis of programs written in the poST language. The paper leverages the process of code analysis and optimization. Section I serves as an introduction to the subject area. Section II overviews the existing approaches for algorithmic analysis of source code and introduces the process-oriented paradigm. Section III describes the proposed methods for complexity analysis. Section IV describes the implementation of the proposed approach in the form of an Eclipse based IDE. Section V presents the results of case studies.",
keywords = "algorithmic complexity, control software specification, poST, process-oriented programming, static analysis",
author = "Artyom Abramenko and Vladimir Zyubin",
year = "2025",
month = aug,
day = "8",
doi = "10.1109/EDM65517.2025.11096883",
language = "English",
isbn = "9781665477376",
series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
publisher = "IEEE Computer Society",
pages = "1430--1434",
booktitle = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
address = "United States",
note = "2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM), EDM 2025 ; Conference date: 27-06-2025 Through 01-07-2025",
url = "https://edm.ieeesiberia.org/",

}

RIS

TY - GEN

T1 - Using Algorithmic Complexity Metrics for Process-Oriented Specifications

AU - Abramenko, Artyom

AU - Zyubin, Vladimir

N1 - Conference code: 26

PY - 2025/8/8

Y1 - 2025/8/8

N2 - In industrial automation software development, software cost, complexity and functionality play a key role. The purpose of this paper is to consider the problem of algorithmic complexity assessment in the context of process-oriented programming languages. Metrics and algorithms for assessing algorithmic complexity are well developed for general-purpose languages, but they are not entirely suitable for control programs that are written in specialized problem-oriented languages, like poST. Therefore, maintainability and readability of programs is one of the main parameters used in assessing the safety of process control programs, and in this regard, the task of developing and implementing static analysis tools for such languages is relevant. The paper focuses on the development and implementation of effective methods and tools for static analysis of programs written in the poST language. The paper leverages the process of code analysis and optimization. Section I serves as an introduction to the subject area. Section II overviews the existing approaches for algorithmic analysis of source code and introduces the process-oriented paradigm. Section III describes the proposed methods for complexity analysis. Section IV describes the implementation of the proposed approach in the form of an Eclipse based IDE. Section V presents the results of case studies.

AB - In industrial automation software development, software cost, complexity and functionality play a key role. The purpose of this paper is to consider the problem of algorithmic complexity assessment in the context of process-oriented programming languages. Metrics and algorithms for assessing algorithmic complexity are well developed for general-purpose languages, but they are not entirely suitable for control programs that are written in specialized problem-oriented languages, like poST. Therefore, maintainability and readability of programs is one of the main parameters used in assessing the safety of process control programs, and in this regard, the task of developing and implementing static analysis tools for such languages is relevant. The paper focuses on the development and implementation of effective methods and tools for static analysis of programs written in the poST language. The paper leverages the process of code analysis and optimization. Section I serves as an introduction to the subject area. Section II overviews the existing approaches for algorithmic analysis of source code and introduces the process-oriented paradigm. Section III describes the proposed methods for complexity analysis. Section IV describes the implementation of the proposed approach in the form of an Eclipse based IDE. Section V presents the results of case studies.

KW - algorithmic complexity

KW - control software specification

KW - poST

KW - process-oriented programming

KW - static analysis

UR - https://www.scopus.com/pages/publications/105014157376

UR - https://www.mendeley.com/catalogue/f46d6a87-1054-3a93-89c8-610621288a97/

U2 - 10.1109/EDM65517.2025.11096883

DO - 10.1109/EDM65517.2025.11096883

M3 - Conference contribution

SN - 9781665477376

T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

SP - 1430

EP - 1434

BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

PB - IEEE Computer Society

T2 - 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)

Y2 - 27 June 2025 through 1 July 2025

ER -

ID: 68938119