Research output: Contribution to journal › Article › peer-review
Topology of PbSnTe:In Layers Versus Indium Concentration. / Ishchenko, D. V.; Akimov, A. N.; Akhundov, I. O. et al.
In: Technical Physics, Vol. 66, No. 7, 07.2021, p. 878-882.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Topology of PbSnTe:In Layers Versus Indium Concentration
AU - Ishchenko, D. V.
AU - Akimov, A. N.
AU - Akhundov, I. O.
AU - Golyashov, V. A.
AU - Klimov, A. E.
AU - Loginov, A. B.
AU - Loginov, B. A.
AU - Pashchin, N. S.
AU - Tarasov, A. S.
AU - Fedosenko, E. V.
AU - Sherstyakova, V. N.
N1 - Funding Information: This study was partially supported by the Russian Foundation for Basic Research, grant no. 20-02-00324. Publisher Copyright: © 2021, Pleiades Publishing, Ltd.
PY - 2021/7
Y1 - 2021/7
N2 - The surface topology of epitaxial films of lead tin telluride solid solution (including with In additive, Pb1 –xSnxTe:In) has been examined using atomic force microscopy. The films have been grown on BaF2(111) single-crystal substrates and on a CaF2/BaF2 buffer layer covering a Si(111) wafer. It has been shown that the relief statistical parameters depend on film growth conditions and the incorporation mechanism of indium, an excess amount of which has been detected on the surface by ex situ XPS.
AB - The surface topology of epitaxial films of lead tin telluride solid solution (including with In additive, Pb1 –xSnxTe:In) has been examined using atomic force microscopy. The films have been grown on BaF2(111) single-crystal substrates and on a CaF2/BaF2 buffer layer covering a Si(111) wafer. It has been shown that the relief statistical parameters depend on film growth conditions and the incorporation mechanism of indium, an excess amount of which has been detected on the surface by ex situ XPS.
UR - http://www.scopus.com/inward/record.url?scp=85124420292&partnerID=8YFLogxK
UR - https://www.mendeley.com/catalogue/274307ce-1f8f-36c7-9126-8bf6326e5c48/
U2 - 10.1134/S1063784221060086
DO - 10.1134/S1063784221060086
M3 - Article
AN - SCOPUS:85124420292
VL - 66
SP - 878
EP - 882
JO - Technical Physics
JF - Technical Physics
SN - 1063-7842
IS - 7
ER -
ID: 35540627