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Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis. / Radeev, Nikita; Vinogradova, Kristina.

International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. p. 1520-1525 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Harvard

Radeev, N & Vinogradova, K 2025, Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis. in International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM, IEEE Computer Society, pp. 1520-1525, 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM), Алтай, Russian Federation, 27.06.2025. https://doi.org/10.1109/EDM65517.2025.11096892

APA

Radeev, N., & Vinogradova, K. (2025). Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis. In International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM (pp. 1520-1525). (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). IEEE Computer Society. https://doi.org/10.1109/EDM65517.2025.11096892

Vancouver

Radeev N, Vinogradova K. Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis. In International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society. 2025. p. 1520-1525. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). doi: 10.1109/EDM65517.2025.11096892

Author

Radeev, Nikita ; Vinogradova, Kristina. / Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. pp. 1520-1525 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

BibTeX

@inproceedings{95edf6f532a44285b2d375c7763ae4e4,
title = "Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis",
abstract = "This research introduces the Semi-Automated Feature Engineering framework, an approach to addressing the complexity of feature engineering in machine learning. The framework addresses an important challenge in data science by creating a systematic method that integrates algorithmic techniques with human expertise, aiming to reduce the computational burden and enhance feature generation processes. The framework is designed to provide a structured approach to feature engineering, enabling data scientists to efficiently create and validate features. Its core methodology involves an iterative process that combines automated feature generation with expert-guided selection, allowing for more targeted and meaningful feature creation. To validate the framework's effectiveness, the research conducted experimental trials in medical diagnostics, using the Orinda Longitudinal Study of Myopia and the Diabetic Retinopathy Debrecen Dataset and a genetic algorithm-based approach for feature engineering. Experimental results demonstrated the framework's potential, with generated features showing consistent performance improvements. The research contributes a systematic framework for feature engineering in data analysis, providing data scientists with a method that balances algorithmic efficiency with human expertise.",
keywords = "feature construction, feature engineering, human-in-the-loop, machine learning, semi-automated frameworks",
author = "Nikita Radeev and Kristina Vinogradova",
year = "2025",
month = aug,
day = "8",
doi = "10.1109/EDM65517.2025.11096892",
language = "English",
isbn = "9781665477376",
series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
publisher = "IEEE Computer Society",
pages = "1520--1525",
booktitle = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
address = "United States",
note = "2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM), EDM 2025 ; Conference date: 27-06-2025 Through 01-07-2025",
url = "https://edm.ieeesiberia.org/",

}

RIS

TY - GEN

T1 - Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis

AU - Radeev, Nikita

AU - Vinogradova, Kristina

N1 - Conference code: 26

PY - 2025/8/8

Y1 - 2025/8/8

N2 - This research introduces the Semi-Automated Feature Engineering framework, an approach to addressing the complexity of feature engineering in machine learning. The framework addresses an important challenge in data science by creating a systematic method that integrates algorithmic techniques with human expertise, aiming to reduce the computational burden and enhance feature generation processes. The framework is designed to provide a structured approach to feature engineering, enabling data scientists to efficiently create and validate features. Its core methodology involves an iterative process that combines automated feature generation with expert-guided selection, allowing for more targeted and meaningful feature creation. To validate the framework's effectiveness, the research conducted experimental trials in medical diagnostics, using the Orinda Longitudinal Study of Myopia and the Diabetic Retinopathy Debrecen Dataset and a genetic algorithm-based approach for feature engineering. Experimental results demonstrated the framework's potential, with generated features showing consistent performance improvements. The research contributes a systematic framework for feature engineering in data analysis, providing data scientists with a method that balances algorithmic efficiency with human expertise.

AB - This research introduces the Semi-Automated Feature Engineering framework, an approach to addressing the complexity of feature engineering in machine learning. The framework addresses an important challenge in data science by creating a systematic method that integrates algorithmic techniques with human expertise, aiming to reduce the computational burden and enhance feature generation processes. The framework is designed to provide a structured approach to feature engineering, enabling data scientists to efficiently create and validate features. Its core methodology involves an iterative process that combines automated feature generation with expert-guided selection, allowing for more targeted and meaningful feature creation. To validate the framework's effectiveness, the research conducted experimental trials in medical diagnostics, using the Orinda Longitudinal Study of Myopia and the Diabetic Retinopathy Debrecen Dataset and a genetic algorithm-based approach for feature engineering. Experimental results demonstrated the framework's potential, with generated features showing consistent performance improvements. The research contributes a systematic framework for feature engineering in data analysis, providing data scientists with a method that balances algorithmic efficiency with human expertise.

KW - feature construction

KW - feature engineering

KW - human-in-the-loop

KW - machine learning

KW - semi-automated frameworks

UR - https://www.scopus.com/pages/publications/105014216105

UR - https://www.mendeley.com/catalogue/1b2ae603-98ac-34f1-823d-d0b67bde2219/

U2 - 10.1109/EDM65517.2025.11096892

DO - 10.1109/EDM65517.2025.11096892

M3 - Conference contribution

SN - 9781665477376

T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

SP - 1520

EP - 1525

BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

PB - IEEE Computer Society

T2 - 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)

Y2 - 27 June 2025 through 1 July 2025

ER -

ID: 68948340