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  1. Charge Transport and the Nature of Traps in Oxygen Deficient Tantalum Oxide

    Gritsenko, V. A., Perevalov, T. V., Voronkovskii, V. A., Gismatulin, A. A., Kruchinin, V. N., Aliev, V. S., Pustovarov, V. A., Prosvirin, I. P. & Roizin, Y., 31 Jan 2018, In: ACS Applied Materials and Interfaces. 10, 4, p. 3769-3775 7 p.

    Research output: Contribution to journalArticlepeer-review

  2. Charge Transport in Amorphous Silicon Nitride

    Novikov, Y. N. & Gritsenko, V. A., Oct 2021, In: Journal of Experimental and Theoretical Physics. 133, 4, p. 488-493 6 p., 13.

    Research output: Contribution to journalArticlepeer-review

  3. Charge Transport in Nonstoichiometric SiO x Obtained by Treatment of Thermal SiO2 in Hydrogen Plasma of Electronic-Cyclotron Resonance

    Iskhakzay, R. M. K., Kruchinin, V. N., Aliev, V. S., Gritsenko, V. A., Dementieva, E. V. & Zamoryanskaya, M. V., Feb 2022, In: Russian Microelectronics. 51, 1, p. 24-35 12 p., 3.

    Research output: Contribution to journalArticlepeer-review

  4. Charge transport in thin hafnium and zirconium oxide films

    Islamov, D. R., Gritsenko, V. A. & Chin, A., 1 Mar 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 2, p. 184-189 6 p.

    Research output: Contribution to journalArticlepeer-review

  5. Charge transport mechanism and amphoteric nature of traps in amorphous silicon nitride

    Novikov, Y. N. & Gritsenko, V. A., 15 Sept 2020, In: Journal of Non-Crystalline Solids. 544, 7 p., 120186.

    Research output: Contribution to journalArticlepeer-review

  6. Charge Transport Mechanism and Trap Origin in Methyl-Terminated Organosilicate Glass Low-κ Dielectrics

    Perevalov, T. V., Gismatulin, A. A., Dolbak, A. E., Gritsenko, V. A., Trofimova, E. S., Pustovarov, V. A., Seregin, D. S., Vorotilov, K. A. & Baklanov, M. R., Feb 2021, In: Physica Status Solidi (A) Applications and Materials Science. 218, 4, 7 p., 2000654.

    Research output: Contribution to journalArticlepeer-review

  7. Charge Transport Mechanism in a Formless Memristor Based on Silicon Nitride

    Orlov, O. M., Gismatulin, A. A., Gritsenko, V. A. & Mizginov, D. S., 1 Sept 2020, In: Russian Microelectronics. 49, 5, p. 372-377 6 p.

    Research output: Contribution to journalArticlepeer-review

  8. Charge Transport Mechanism in Atomic Layer Deposited Oxygen-Deficient TaOx Films

    Gismatulin, A., Gritsenko, V., Perevalov, T., Kuzmichev, D., Chernikova, A. & Markeev, A., Mar 2021, In: Physica Status Solidi (B) Basic Research. 258, 3, 6 p., 2000432.

    Research output: Contribution to journalArticlepeer-review

  9. Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers

    Pil’nik, A. A., Chernov, A. A. & Islamov, D. R., 1 Dec 2020, In: Scientific Reports. 10, 1, 10 p., 15759.

    Research output: Contribution to journalArticlepeer-review

  10. Charge transport mechanism in [GeOx](z)[SiO2](1-z) based MIS structures

    Yushkov, I. D., Gismatulin, A. A., Prosvirin, I. P., Kamaev, G. N., Marin, D. V., Vergnat, M. & Volodin, V. A., 9 Dec 2024, In: Applied Physics Letters. 125, 24, 242901.

    Research output: Contribution to journalArticlepeer-review