• A. S. Kozhukhov
  • D. V. Sheglov
  • A. V. Latyshev
Original languageEnglish
Pages (from-to)420-422
Number of pages3
JournalSemiconductors
Volume51
Issue number4
DOIs
Publication statusPublished - 1 Apr 2017

    OECD FOS+WOS

ID: 10036005