Possibilities of Characterizing the Crystal Parameters of Cd xHg1 – xTe Structures on GaAs Substrates by the Method of Generation of the Probe-Radiation Second Harmonic in Reflection Geometry

Possibilities of Characterizing the Crystal Parameters of Cd_xHg_1 – _xTe Structures on GaAs Substrates by the Method of Generation of the Probe-Radiation Second Harmonic in Reflection Geometry

Research output: Contribution to journal › Article › peer-review

azimuthal angular dependences, CdHg Te structure, GaAs substrates, noncentrosymmetric sphalerite-type crystals, second harmonic, CdxHg1- Te-x structure, DISLOCATIONS, HETEROEPITAXIAL STRUCTURES

ID: 23664870