TY - JOUR

T1 - Obtaining the Effective Dielectric Permittivity of a Conducting Surface in the Terahertz Range via the Characteristics of Surface Plasmon Polaritons

AU - Gerasimov, Vasily Valerievich

AU - Nikitin, Alexey Konstantinovich

AU - Lemzyakov, Alexey Georgievich

AU - Azarov, Ivan Aleksandrovich

AU - Kotelnikov, Igor Aleksandrovich

N1 - The work was done using equipment from the shared research center SSTRC on the basis of the Novosibirsk FEL at BINP SB RAS. Публикация для корректировки.

PY - 2023/7

Y1 - 2023/7

N2 - Featured Application: Surface plasmon refractometry of conducting surfaces applied in terahertz plasmonic integrated circuits and communication lines. With the intensive development of data transmitting and processing devices in the terahertz (THz) frequency range, an important part of which are integrated plasmonic components and communication lines, it becomes necessary to measure correctly the optical constants of their conductive surfaces. In this paper, we describe a reliable method for determining the effective permittivity εm of a metal surface from the measured characteristics (refractive and absorption indices) of THz surface plasmon polaritons (SPPs). The novelty of the method is the conduction of measurements on a metal surface with a dielectric layer of subwavelength thickness, suppressing the radiative losses of SPPs, which are not taken into account by the SPP dispersion equation. The method is tested on a number of flat “gold sputtering–zinc sulfide layer–air” structures with the use of the THz radiation (λ0 = 141 μm) from the Novosibirsk free electron laser (NovoFEL). The SPP characteristics are determined from interferograms measured with a plasmon Michelson interferometer. It is found that the method allows a significant increase in the accuracy of the εm in comparison with measurements on the same metal surface without a dielectric layer.

AB - Featured Application: Surface plasmon refractometry of conducting surfaces applied in terahertz plasmonic integrated circuits and communication lines. With the intensive development of data transmitting and processing devices in the terahertz (THz) frequency range, an important part of which are integrated plasmonic components and communication lines, it becomes necessary to measure correctly the optical constants of their conductive surfaces. In this paper, we describe a reliable method for determining the effective permittivity εm of a metal surface from the measured characteristics (refractive and absorption indices) of THz surface plasmon polaritons (SPPs). The novelty of the method is the conduction of measurements on a metal surface with a dielectric layer of subwavelength thickness, suppressing the radiative losses of SPPs, which are not taken into account by the SPP dispersion equation. The method is tested on a number of flat “gold sputtering–zinc sulfide layer–air” structures with the use of the THz radiation (λ0 = 141 μm) from the Novosibirsk free electron laser (NovoFEL). The SPP characteristics are determined from interferograms measured with a plasmon Michelson interferometer. It is found that the method allows a significant increase in the accuracy of the εm in comparison with measurements on the same metal surface without a dielectric layer.

KW - conducting surface

KW - dielectric permittivity of metals

KW - free-electron lasers

KW - plasmon Michelson interferometer

KW - surface plasmon polaritons

KW - terahertz plasmonics

KW - thin dielectric layers

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85164958895&origin=inward&txGid=4952b7c908a666dced8c55f1b65b5f52

UR - https://www.mendeley.com/catalogue/c62416b3-2dc9-300a-b189-e62027f6429e/

U2 - 10.3390/app13137898

DO - 10.3390/app13137898

M3 - Article

VL - 13

JO - Applied Sciences (Switzerland)

JF - Applied Sciences (Switzerland)

SN - 2076-3417

IS - 13

M1 - 7898

ER -